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Meng-Yao Liu

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2005
2EEShaolei Quan, Meng-Yao Liu, Chin-Long Wey: Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. DFT 2005: 563-572
2004
1EEChin-Long Wey, Meng-Yao Liu: Burn-In Stress Test of Analog CMOS ICs. Asian Test Symposium 2004: 360-365

Coauthor Index

1Shaolei Quan [2]
2Chin-Long Wey [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)