| |
| 2005 | ||
|---|---|---|
| 2 | EE | Shaolei Quan, Meng-Yao Liu, Chin-Long Wey: Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. DFT 2005: 563-572 |
| 2004 | ||
| 1 | EE | Chin-Long Wey, Meng-Yao Liu: Burn-In Stress Test of Analog CMOS ICs. Asian Test Symposium 2004: 360-365 |
| 1 | Shaolei Quan | [2] |
| 2 | Chin-Long Wey | [1] [2] |