| 2006 |
|---|
| 10 | EE | Geewhun Seok,
Il-soo Lee,
Tony Ambler,
B. F. Womack:
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.
DFT 2006: 145-156 |
| 2005 |
|---|
| 9 | EE | Il-soo Lee,
Tony Ambler:
Two efficient methods to reduce power and testing time.
ISLPED 2005: 167-172 |
| 8 | EE | Yu-Ting Lin,
Tony Ambler:
An Economic Selecting Model for DFT Strategies.
VTS 2005: 412-417 |
| 2004 |
|---|
| 7 | EE | Il-soo Lee,
Yong Min Hur,
Tony Ambler:
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.
Asian Test Symposium 2004: 94-97 |
| 2001 |
|---|
| 6 | | Tony Ambler:
Test Strategies and Marriage Partners.
IEEE Design & Test of Computers 18(5): 128- (2001) |
| 5 | | Tony Ambler,
Donald L. Wheater:
Test Trade-Offs Take Center Stage at ITC.
IEEE Design & Test of Computers 18(5): 59- (2001) |
| 4 | EE | Louis Y. Ungar,
Tony Ambler:
Economics of Built-in Self-Test.
IEEE Design & Test of Computers 18(5): 70-79 (2001) |
| 1999 |
|---|
| 3 | | Tony Ambler,
Ben Bennetts:
Guest Editors' Introduction: Test and the Product Life Cycle.
IEEE Design & Test of Computers 16(3): 20-22 (1999) |
| 1997 |
|---|
| 2 | | Tony Ambler,
Magdy S. Abadir:
Design and Test Economics-An Extra Dimension.
IEEE Design & Test of Computers 14(3): 15-16 (1997) |
| 1994 |
|---|
| 1 | EE | Magdy S. Abadir,
Tony Ambler:
Introduction.
J. Electronic Testing 5(2-3): 129-130 (1994) |
