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Nagesh Tamarapalli

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2008
12EESrikanth Venkataraman, Nagesh Tamarapalli: DFM / DFT / SiliconDebug / Diagnosis. VLSI Design 2008: 5-6
2006
11EEDavid Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14
2004
10EEWu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski: Compactor Independent Direct Diagnosis. Asian Test Symposium 2004: 204-209
2003
9EEBrady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040
8EEFrank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski: Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220
7EEXijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli: High-Frequency, At-Speed Scan Testing. IEEE Design & Test of Computers 20(5): 17-25 (2003)
6EEJanusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Design & Test of Computers 20(5): 58-66 (2003)
2002
5EEJanusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
2000
4EEJanusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer: Automated synthesis of phase shifters for built-in self-testapplications. IEEE Trans. on CAD of Integrated Circuits and Systems 19(10): 1175-1188 (2000)
1999
3 Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski: Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367
1998
2EEJanusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer: Automated synthesis of large phase shifters for built-in self-test. ITC 1998: 1047-1056
1996
1 Nagesh Tamarapalli, Janusz Rajski: Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. ITC 1996: 649-658

Coauthor Index

1David Abercrombie [11]
2Ralf Arnold [8]
3Matthias Beck [8]
4Brady Benware [9]
5Wu-Tung Cheng [10]
6Geir Eide [5]
7Tony Fryars [3]
8Abu S. M. Hassan [3]
9Andre Hertwig [5]
10Graham Hetherington [3]
11Yu Huang [10]
12Mark Kassab [3] [5] [6] [8]
13Bernd Koenemann [11]
14Prabhu Krishnamurthy [9]
15Xijiang Lin [7]
16Robert Madge [9]
17Grzegorz Mrugalski [5]
18Peter Muhmenthaler [8]
19Nilanjan Mukherjee [5] [6] [8]
20Frank Poehl [8]
21Ron Press [7]
22Jun Qian [5] [6]
23Janusz Rajski [1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
24Sreenevasan Ranganathan [9]
25Paul Reuter [7]
26Thomas Rinderknecht [7]
27Chris Schuermyer [9]
28Bruce Swanson [7]
29Rob Thompson [5]
30Kun-Han Tsai [5] [9] [10]
31Jerzy Tyszer [2] [4] [5] [6]
32Srikanth Venkataraman [11] [12]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)