Nagesh Tamarapalli

2008
12	EE	Srikanth Venkataraman, Nagesh Tamarapalli: DFM / DFT / SiliconDebug / Diagnosis. VLSI Design 2008: 5-6
2006
11	EE	David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14
2004
10	EE	Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski: Compactor Independent Direct Diagnosis. Asian Test Symposium 2004: 204-209
2003
9	EE	Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040
8	EE	Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski: Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220
7	EE	Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli: High-Frequency, At-Speed Scan Testing. IEEE Design & Test of Computers 20(5): 17-25 (2003)
6	EE	Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Design & Test of Computers 20(5): 58-66 (2003)
2002
5	EE	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
2000
4	EE	Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer: Automated synthesis of phase shifters for built-in self-testapplications. IEEE Trans. on CAD of Integrated Circuits and Systems 19(10): 1175-1188 (2000)
1999
3		Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski: Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367
1998
2	EE	Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer: Automated synthesis of large phase shifters for built-in self-test. ITC 1998: 1047-1056
1996
1		Nagesh Tamarapalli, Janusz Rajski: Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. ITC 1996: 649-658

Coauthor Index

1	David Abercrombie	[11]
2	Ralf Arnold	[8]
3	Matthias Beck	[8]
4	Brady Benware	[9]
5	Wu-Tung Cheng	[10]
6	Geir Eide	[5]
7	Tony Fryars	[3]
8	Abu S. M. Hassan	[3]
9	Andre Hertwig	[5]
10	Graham Hetherington	[3]
11	Yu Huang	[10]
12	Mark Kassab	[3] [5] [6] [8]
13	Bernd Koenemann	[11]
14	Prabhu Krishnamurthy	[9]
15	Xijiang Lin	[7]
16	Robert Madge	[9]
17	Grzegorz Mrugalski	[5]
18	Peter Muhmenthaler	[8]
19	Nilanjan Mukherjee	[5] [6] [8]
20	Frank Poehl	[8]
21	Ron Press	[7]
22	Jun Qian	[5] [6]
23	Janusz Rajski	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
24	Sreenevasan Ranganathan	[9]
25	Paul Reuter	[7]
26	Thomas Rinderknecht	[7]
27	Chris Schuermyer	[9]
28	Bruce Swanson	[7]
29	Rob Thompson	[5]
30	Kun-Han Tsai	[5] [9] [10]
31	Jerzy Tyszer	[2] [4] [5] [6]
32	Srikanth Venkataraman	[11] [12]