| 2004 |
|---|
| 7 | EE | Yi-Ming Sheng,
Ming-Jun Hsiao,
Tsin-Yuan Chang:
A Measurement Unit for Input Signal Analysis of SRAM Sense Amplifier.
Asian Test Symposium 2004: 272-276 |
| 6 | EE | Ming-Jun Hsiao,
Jing-Reng Huang,
Tsin-Yuan Chang:
A Built-In Parametric Timing Measurement Unit.
IEEE Design & Test of Computers 21(4): 322-330 (2004) |
| 2002 |
|---|
| 5 | EE | Shu-Rong Lee,
Ming-Jun Hsiao,
Tsin-Yuan Chang:
An Access Timing Measurement Unit of Embedded Memory.
Asian Test Symposium 2002: 104- |
| 4 | EE | Sheng-Hung Hsieh,
Ming-Jun Hsiao,
Tsin-Yuan Chang:
An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters.
Asian Test Symposium 2002: 266- |
| 2001 |
|---|
| 3 | EE | Jeng-Horng Tsai,
Ming-Jun Hsiao,
Tsin-Yuan Chang:
An Embedded Built-in-Self-Test Approach for Digital-to-Analog Converters.
Asian Test Symposium 2001: 423- |
| 2 | EE | Ming-Jun Hsiao,
Jing-Reng Huang,
Shao-Shen Yang,
Tsin-Yuan Chang:
A low-cost CMOS time interval measurement core.
ISCAS (4) 2001: 190-193 |
| 1 | | Ming-Jun Hsiao,
Jing-Reng Huang,
Shao-Shen Yang,
Tsin-Yuan Chang:
A built-in timing parametric measurement unit.
ITC 2001: 315-322 |
