![]() | ![]() |
2004 | ||
---|---|---|
1 | EE | Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada: I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117 |
1 | Masaki Hashizume | [1] |
2 | Takeshi Koyama | [1] |
3 | Tetsuo Tada | [1] |
4 | Takeomi Tamesada | [1] |
5 | Daisuke Yoneda | [1] |
6 | Hiroyuki Yotsuyanagi | [1] |