| 2006 |
|---|
| 5 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
J. Electronic Testing 22(3): 287-296 (2006) |
| 2005 |
|---|
| 4 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian Hage-Hassan:
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures.
VTS 2005: 183-188 |
| 3 | EE | Simone Borri,
Magali Bastian Hage-Hassan,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
J. Electronic Testing 21(2): 169-179 (2005) |
| 2 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
J. Electronic Testing 21(5): 551-561 (2005) |
| 2004 |
|---|
| 1 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.
Asian Test Symposium 2004: 266-271 |
