Kohei Miyase

2008
22	EE	Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen: Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
21	EE	Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
20	EE	Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara: A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions 91-D(3): 667-674 (2008)
19	EE	Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008)
18	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing 24(4): 379-391 (2008)
2007
17	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532
16	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007)
2006
15	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
14	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65
13	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
2005
12	EE	Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223
11	EE	Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005)
2004
10	EE	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy: Multiple Scan Tree Design with Test Vector Modification. Asian Test Symposium 2004: 76-81
9	EE	Kohei Miyase, Seiji Kajihara: XID: Don't care identification of test patterns for combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 23(2): 321-326 (2004)
2003
8	EE	Kohei Miyase, Seiji Kajihara: Optimal Scan Tree Construction with Test Vector Modification for Test Compression. Asian Test Symposium 2003: 136-141
7	EE	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz: On test data volume reduction for multiple scan chain designs. ACM Trans. Design Autom. Electr. Syst. 8(4): 460-469 (2003)
2002
6	EE	Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy: Test Data Compression Using Don?t-Care Identification and Statistical Encoding. Asian Test Symposium 2002: 67-
5	EE	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy: A Method of Static Test Compaction Based on Don't Care Identification. DELTA 2002: 392-395
4	EE	Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy: Don't-Care Identification on Specific Bits of Test Patterns. ICCD 2002: 194-199
3	EE	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz: On Test Data Volume Reduction for Multiple Scan Chain Designs. VTS 2002: 103-110
2	EE	Seiji Kajihara, Koji Ishida, Kohei Miyase: Test Vector Modification for Power Reduction during Scan Testing. VTS 2002: 160-165
2001
1	EE	Seiji Kajihara, Kohei Miyase: On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. ICCAD 2001: 364-369

Coauthor Index

1	Khader S. Abdel-Hafez	[14]
2	Takashi Aikyo	[21]
3	Bernd Becker	[22]
4	Piet Engelke	[22]
5	Hiroshi Furukawa	[21]
6	Kazumi Hatayama	[21]
7	Koji Ishida	[2]
8	Hideaki Ito	[21]
9	Seiji Kajihara	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22]
10	Kozo Kinoshita	[13] [14] [16] [18]
11	Yoshihiro Minamoto	[11]
12	Yusuke Nakamura	[20] [22]
13	Kenji Noda	[21]
14	Yuji Ohsumi	[17]
15	Ilia Polian	[22]
16	Irith Pomeranz	[3] [4] [6] [7]
17	Sudhakar M. Reddy	[3] [4] [5] [6] [7] [10] [12] [19]
18	Kewal K. Saluja	[11] [13] [14] [15] [16] [17] [18]
19	Stefan Spinner	[22]
20	Tatsuya Suzuki	[11] [14] [15] [16] [17] [18]
21	Kenjiro Taniguchi	[6]
22	Kenta Terashima	[12] [19]
23	Laung-Terng Wang	[11] [13] [14] [15] [16] [18]
24	Xiaoqing Wen	[11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22]
25	Yuta Yamato	[13] [15] [20] [21]