2007 |
14 | EE | Rei-Fu Huang,
Chao-Hsun Chen,
Cheng-Wen Wu:
Economic Aspects of Memory Built-in Self-Repair.
IEEE Design & Test of Computers 24(2): 164-172 (2007) |
13 | EE | Rei-Fu Huang,
Jin-Fu Li,
Jen-Chieh Yeh,
Cheng-Wen Wu:
Raisin: Redundancy Analysis Algorithm Simulation.
IEEE Design & Test of Computers 24(4): 386-396 (2007) |
2005 |
12 | EE | Jin-Fu Li,
Jen-Chieh Yeh,
Rei-Fu Huang,
Cheng-Wen Wu:
A built-in self-repair design for RAMs with 2-D redundancy.
IEEE Trans. VLSI Syst. 13(6): 742-745 (2005) |
2004 |
11 | EE | Rei-Fu Huang,
Yan-Ting Lai,
Yung-Fa Chou,
Cheng-Wen Wu:
SRAM delay fault modeling and test algorithm development.
ASP-DAC 2004: 104-109 |
10 | EE | Chih-Tsun Huang,
Jen-Chieh Yeh,
Yuan-Yuan Shih,
Rei-Fu Huang,
Cheng-Wen Wu:
On Test and Diagnostics of Flash Memories.
Asian Test Symposium 2004: 260-265 |
9 | EE | Rei-Fu Huang,
Chin-Lung Su,
Cheng-Wen Wu,
Shen-Tien Lin,
Kun-Lun Luo,
Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair.
Asian Test Symposium 2004: 366-371 |
8 | EE | Chin-Lung Su,
Rei-Fu Huang,
Cheng-Wen Wu,
Chien-Chung Hung,
Ming-Jer Kao,
Yeong-Jar Chang,
Wen Ching Wu:
MRAM Defect Analysis and Fault Modeli.
ITC 2004: 124-133 |
7 | EE | Li-Ming Denq,
Rei-Fu Huang,
Cheng-Wen Wu,
Yeong-Jar Chang,
Wen Ching Wu:
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
MTDT 2004: 65-69 |
2003 |
6 | EE | Rei-Fu Huang,
Yung-Fa Chou,
Cheng-Wen Wu:
Defect Oriented Fault Analysis for SRAM.
Asian Test Symposium 2003: 256-261 |
5 | EE | Chin-Lung Su,
Rei-Fu Huang,
Cheng-Wen Wu:
A Processor-Based Built-In Self-Repair Design for Embedded Memories.
Asian Test Symposium 2003: 366-371 |
4 | EE | Jin-Fu Li,
Jen-Chieh Yeh,
Rei-Fu Huang,
Cheng-Wen Wu,
Peir-Yuan Tsai,
Archer Hsu,
Eugene Chow:
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy.
ITC 2003: 393-402 |
3 | EE | Rei-Fu Huang,
Li-Ming Denq,
Cheng-Wen Wu,
Jin-Fu Li:
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories.
MTDT 2003: 53- |
2002 |
2 | EE | Rei-Fu Huang,
Jin-Fu Li,
Jen-Chieh Yeh,
Cheng-Wen Wu:
A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories.
IOLTW 2002: 262- |
1 | EE | Rei-Fu Huang,
Jin-Fu Li,
Jen-Chieh Yeh,
Cheng-Wen Wu:
A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories.
MTDT 2002: 68- |