| |
| 2004 | ||
|---|---|---|
| 1 | EE | Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang: Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371 |
| 1 | Yeong-Jar Chang | [1] |
| 2 | Rei-Fu Huang | [1] |
| 3 | Kun-Lun Luo | [1] |
| 4 | Chin-Lung Su | [1] |
| 5 | Cheng-Wen Wu | [1] |