C. C. Su

2007
2	EE	Marcelo Lubaszewski, Andrew Richardson, C. C. Su: Guest Editorial. J. Electronic Testing 23(6): 469 (2007)
2004
1	EE	C. C. Su, C. S. Chang, H. W. Huang, D. S. Tu, C. L. Lee, Jerry C. H. Lin: Dynamic Analog Testing via ATE Digital Test Channels. Asian Test Symposium 2004: 308-312

Coauthor Index

1	C. S. Chang	[1]
2	H. W. Huang	[1]
3	C. L. Lee	[1]
4	Jerry C. H. Lin	[1]
5	Marcelo Lubaszewski	[2]
6	Andrew Richardson	[2]
7	D. S. Tu	[1]

Colors in the list of coauthors