| 2008 |
|---|
| 9 | EE | Youhua Shi,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki:
GECOM: Test data compression combined with all unknown response masking.
ASP-DAC 2008: 577-582 |
| 8 | EE | Kazuyuki Tanimura,
Ryuta Nara,
Shunitsu Kohara,
Kazunori Shimizu,
Youhua Shi,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki:
Scalable unified dual-radix architecture for Montgomery multiplication in GF(P) and GF(2n).
ASP-DAC 2008: 697-702 |
| 7 | EE | Youhua Shi,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki:
A Secure Test Technique for Pipelined Advanced Encryption Standard.
IEICE Transactions 91-D(3): 776-780 (2008) |
| 2007 |
|---|
| 6 | EE | Youhua Shi,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki:
Design for Secure Test - A Case Study on Pipelined Advanced Encryption Standard.
ISCAS 2007: 149-152 |
| 2006 |
|---|
| 5 | EE | Youhua Shi,
Nozomu Togawa,
Shinji Kimura,
Masao Yanagisawa,
Tatsuo Ohtsuki:
FCSCAN: an efficient multiscan-based test compression technique for test cost reduction.
ASP-DAC 2006: 653-658 |
| 4 | EE | Gang Zeng,
Youhua Shi,
Toshinori Takabatake,
Masao Yanagisawa,
Hideo Ito:
Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters.
DFT 2006: 136-144 |
| 3 | EE | Youhua Shi,
Nozomu Togawa,
Shinji Kimura,
Masao Yanagisawa,
Tatsuo Ohtsuki:
Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains.
IEICE Transactions 89-A(4): 996-1004 (2006) |
| 2005 |
|---|
| 2 | EE | Youhua Shi,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki,
Shinji Kimura:
Low Power Test Compression Technique for Designs with Multiple Scan Chain.
Asian Test Symposium 2005: 386-389 |
| 2004 |
|---|
| 1 | EE | Youhua Shi,
Shinji Kimura,
Nozomu Togawa,
Masao Yanagisawa,
Tatsuo Ohtsuki:
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test.
Asian Test Symposium 2004: 432-437 |
