Kenichi Ichino

2004
3	EE	Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki: Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters. Asian Test Symposium 2004: 190-195
2003
2	EE	Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka: Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. Asian Test Symposium 2003: 28-31
2001
1	EE	Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara: Hybrid BIST Using Partially Rotational Scan. Asian Test Symposium 2001: 379-384

Coauthor Index

1	Masayuki Arai	[2] [3]
2	Takeshi Asakawa	[1]
3	Satoshi Fukumoto	[1] [2] [3]
4	Hiroyuki Itabashi	[2]
5	Kazuhiko Iwasaki	[1] [2] [3]
6	Seiji Kajihara	[1]
7	Harunobu Kurokawa	[3]
8	Takashi Murai	[2]
9	Nobuyuki Otsuka	[2]
10	Masayuki Satoh	[2]
11	Yuki Yamagata	[2]