| 2007 |
|---|
| 13 | | Luigi Dilillo,
Bashir M. Al-Hashimi:
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories.
DDECS 2007: 173-178 |
| 12 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.
J. Electronic Testing 23(5): 435-444 (2007) |
| 2006 |
|---|
| 11 | EE | Luigi Dilillo,
Paul M. Rosinger,
Bashir M. Al-Hashimi,
Patrick Girard:
Minimizing test power in SRAM through reduction of pre-charge activity.
DATE 2006: 1159-1164 |
| 10 | | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.
DDECS 2006: 256-261 |
| 9 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
J. Electronic Testing 22(3): 287-296 (2006) |
| 8 | EE | Luigi Dilillo,
Paul M. Rosinger,
Bashir M. Al-Hashimi,
Patrick Girard:
Reducing Power Dissipation in SRAM during Test.
J. Low Power Electronics 2(2): 271-280 (2006) |
| 2005 |
|---|
| 7 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian:
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.
DAC 2005: 857-862 |
| 6 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Magali Bastian Hage-Hassan:
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures.
VTS 2005: 183-188 |
| 5 | EE | Simone Borri,
Magali Bastian Hage-Hassan,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
J. Electronic Testing 21(2): 169-179 (2005) |
| 4 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
J. Electronic Testing 21(5): 551-561 (2005) |
| 2004 |
|---|
| 3 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri,
Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.
Asian Test Symposium 2004: 266-271 |
| 2 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri:
March iC-: An Improved Version of March C- for ADOFs Detection.
VTS 2004: 129-138 |
| 2003 |
|---|
| 1 | EE | Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Arnaud Virazel,
Simone Borri:
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders.
Asian Test Symposium 2003: 250-255 |
