2008 | ||
---|---|---|
35 | EE | Ming-Chang Hsieh, Chih-Tsun Huang: An embedded infrastructure of debug and trace interface for the DSP platform. DAC 2008: 866-871 |
34 | EE | Jyu-Yuan Lai, Chih-Tsun Huang: Elixir: High-Throughput Cost-Effective Dual-Field Processors and the Design Framework for Elliptic Curve Cryptography. IEEE Trans. VLSI Syst. 16(11): 1567-1580 (2008) |
2007 | ||
33 | EE | Shin-Yi Lin, Chih-Tsun Huang: A High-Throughput Low-Power AES Cipher for Network Applications. ASP-DAC 2007: 595-600 |
32 | EE | Cheng-Hung Lin, Chih-Tsun Huang, Chang-Ping Jiang, Shih-Chieh Chang: Optimization of Pattern Matching Circuits for Regular Expression on FPGA. IEEE Trans. VLSI Syst. 15(12): 1303-1310 (2007) |
2006 | ||
31 | EE | Chen-Hsing Wang, Chih-Yen Lo, Min-Sheng Lee, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang: A network security processor design based on an integrated SOC design and test platform. DAC 2006: 490-495 |
30 | EE | Cheng-Hung Lin, Chih-Tsun Huang, Chang-Ping Jiang, Shih-Chieh Chang: Optimization of regular expression pattern matching circuits on FPGA. DATE Designers' Forum 2006: 12-17 |
2005 | ||
29 | EE | Chih-Pin Su, Chia-Lung Horng, Chih-Tsun Huang, Cheng-Wen Wu: A configurable AES processor for enhanced security. ASP-DAC 2005: 361-366 |
28 | EE | Chih-Pin Su, Chen-Hsing Wang, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu: Design and test of a scalable security processor. ASP-DAC 2005: 372-375 |
27 | EE | Chun-Chieh Wang, Jing-Jia Liou, Yen-Lin Peng, Chih-Tsun Huang, Cheng-Wen Wu: A BIST Scheme for FPGA Interconnect Delay Faults. VTS 2005: 201-206 |
2004 | ||
26 | EE | Mao-Yin Wang, Chih-Pin Su, Chih-Tsun Huang, Cheng-Wen Wu: An HMAC processor with integrated SHA-1 and MD5 algorithms. ASP-DAC 2004: 456-458 |
25 | EE | Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu: On Test and Diagnostics of Flash Memories. Asian Test Symposium 2004: 260-265 |
24 | EE | Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu: Failure Factor Based Yield Enhancement for SRAM Designs. DFT 2004: 20-28 |
23 | EE | Yen-Lin Peng, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu: An Application-Independent Delay Testing Methodology for Island-Style FPGA. DFT 2004: 478-486 |
22 | EE | Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Chih-Yen Lo, Li-Ming Denq, Chih-Tsun Huang, Shin-Wei Hung, Jye-Yuan Lee: An SOC Test Integration Platform and Its Industrial Realization. ITC 2004: 1213-1222 |
2003 | ||
21 | EE | Kuo-Liang Cheng, Chih-Wea Wang, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu: FAME: A Fault-Pattern Based Memory Failure Analysis Framework. ICCAD 2003: 595-598 |
20 | EE | Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang: Fault Pattern Oriented Defect Diagnosis for Memories. ITC 2003: 29-38 |
19 | EE | Chih-Wea Wang, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu: Test and Diagnosis of Word-Oriented Multiport Memories. VTS 2003: 248-253 |
18 | EE | Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu: Built-in redundancy analysis for memory yield improvement. IEEE Transactions on Reliability 52(4): 386-399 (2003) |
2002 | ||
17 | EE | Chih-Wea Wang, Jing-Reng Huang, Yen-Fu Lin, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu, Youn-Long Lin: Test Scheduling of BISTed Memory Cores for SOC. Asian Test Symposium 2002: 356- |
16 | EE | Huan-Shan Hsu, Jing-Reng Huang, Kuo-Liang Cheng, Chih-Wea Wang, Chih-Tsun Huang, Cheng-Wen Wu, Youn-Long Lin: Test Scheduling and Test Access Architecture Optimization for System-on-Chip. Asian Test Symposium 2002: 411- |
15 | EE | Jen-Chieh Yeh, Chi-Feng Wu, Kuo-Liang Cheng, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu: Flash Memory Built-In Self-Test Using March-Like Algorithm. DELTA 2002: 137-141 |
14 | EE | Sau-Kwo Chiu, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu: Diagonal Test and Diagnostic Schemes for Flash Memorie. ITC 2002: 37-46 |
13 | EE | Kuo-Liang Cheng, Jen-Chieh Yeh, Chih-Wea Wang, Chih-Tsun Huang, Cheng-Wen Wu: RAMSES-FT: A Fault Simulator for Flash Memory Testing and Diagnostics. VTS 2002: 281-288 |
12 | EE | Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu: Fault simulation and test algorithm generation for random accessmemories. IEEE Trans. on CAD of Integrated Circuits and Systems 21(4): 480-490 (2002) |
2001 | ||
11 | EE | Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang, Shyh-Horng Lin, Hsin-Po Wang: A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters. Asian Test Symposium 2001: 103- |
10 | EE | Kuo-Liang Cheng, Chia-Ming Hsueh, Jing-Reng Huang, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu: Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip. Asian Test Symposium 2001: 91-96 |
9 | EE | Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Chih-Wea Wang, Cheng-Wen Wu: Simulation-Based Test Algorithm Generation and Port Scheduling for Multi-Port Memories. DAC 2001: 301-306 |
8 | Jin-Fu Li, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu: March-based RAM diagnosis algorithms for stuck-at and coupling faults. ITC 2001: 758-767 | |
2000 | ||
7 | EE | Chih-Tsun Huang, Jing-Reng Huang, Cheng-Wen Wu: A programmable built-in self-test core for embedded memories. ASP-DAC 2000: 11-12 |
6 | EE | Chuang Cheng, Chih-Tsun Huang, Jing-Reng Huang, Cheng-Wen Wu, Chen-Jong Wey, Ming-Chang Tsai: BRAINS: A BIST Compiler for Embedded Memories. DFT 2000: 299- |
5 | Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-Liang Cheng, Cheng-Wen Wu: Error Catch and Analysis for Semiconductor Memories Using March Tests. ICCAD 2000: 468-471 | |
4 | EE | Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu: Simulation-Based Test Algorithm Generation for Random Access Memories. VTS 2000: 291-296 |
1999 | ||
3 | EE | Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu: RAMSES: A Fast Memory Fault Simulator. DFT 1999: 165-173 |
2 | EE | Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang: A Programmable BIST Core for Embedded DRAM. IEEE Design & Test of Computers 16(1): 59-70 (1999) |
1997 | ||
1 | EE | Chih-Tsun Huang, Cheng-Wen Wu: High-speed C-testable systolic array design for Galois-field inversion. ED&TC 1997: 342-346 |