| 2008 |
| 35 | EE | Ming-Chang Hsieh,
Chih-Tsun Huang:
An embedded infrastructure of debug and trace interface for the DSP platform.
DAC 2008: 866-871 |
| 34 | EE | Jyu-Yuan Lai,
Chih-Tsun Huang:
Elixir: High-Throughput Cost-Effective Dual-Field Processors and the Design Framework for Elliptic Curve Cryptography.
IEEE Trans. VLSI Syst. 16(11): 1567-1580 (2008) |
| 2007 |
| 33 | EE | Shin-Yi Lin,
Chih-Tsun Huang:
A High-Throughput Low-Power AES Cipher for Network Applications.
ASP-DAC 2007: 595-600 |
| 32 | EE | Cheng-Hung Lin,
Chih-Tsun Huang,
Chang-Ping Jiang,
Shih-Chieh Chang:
Optimization of Pattern Matching Circuits for Regular Expression on FPGA.
IEEE Trans. VLSI Syst. 15(12): 1303-1310 (2007) |
| 2006 |
| 31 | EE | Chen-Hsing Wang,
Chih-Yen Lo,
Min-Sheng Lee,
Jen-Chieh Yeh,
Chih-Tsun Huang,
Cheng-Wen Wu,
Shi-Yu Huang:
A network security processor design based on an integrated SOC design and test platform.
DAC 2006: 490-495 |
| 30 | EE | Cheng-Hung Lin,
Chih-Tsun Huang,
Chang-Ping Jiang,
Shih-Chieh Chang:
Optimization of regular expression pattern matching circuits on FPGA.
DATE Designers' Forum 2006: 12-17 |
| 2005 |
| 29 | EE | Chih-Pin Su,
Chia-Lung Horng,
Chih-Tsun Huang,
Cheng-Wen Wu:
A configurable AES processor for enhanced security.
ASP-DAC 2005: 361-366 |
| 28 | EE | Chih-Pin Su,
Chen-Hsing Wang,
Kuo-Liang Cheng,
Chih-Tsun Huang,
Cheng-Wen Wu:
Design and test of a scalable security processor.
ASP-DAC 2005: 372-375 |
| 27 | EE | Chun-Chieh Wang,
Jing-Jia Liou,
Yen-Lin Peng,
Chih-Tsun Huang,
Cheng-Wen Wu:
A BIST Scheme for FPGA Interconnect Delay Faults.
VTS 2005: 201-206 |
| 2004 |
| 26 | EE | Mao-Yin Wang,
Chih-Pin Su,
Chih-Tsun Huang,
Cheng-Wen Wu:
An HMAC processor with integrated SHA-1 and MD5 algorithms.
ASP-DAC 2004: 456-458 |
| 25 | EE | Chih-Tsun Huang,
Jen-Chieh Yeh,
Yuan-Yuan Shih,
Rei-Fu Huang,
Cheng-Wen Wu:
On Test and Diagnostics of Flash Memories.
Asian Test Symposium 2004: 260-265 |
| 24 | EE | Yu-Tsao Hsing,
Chih-Wea Wang,
Ching-Wei Wu,
Chih-Tsun Huang,
Cheng-Wen Wu:
Failure Factor Based Yield Enhancement for SRAM Designs.
DFT 2004: 20-28 |
| 23 | EE | Yen-Lin Peng,
Jing-Jia Liou,
Chih-Tsun Huang,
Cheng-Wen Wu:
An Application-Independent Delay Testing Methodology for Island-Style FPGA.
DFT 2004: 478-486 |
| 22 | EE | Kuo-Liang Cheng,
Jing-Reng Huang,
Chih-Wea Wang,
Chih-Yen Lo,
Li-Ming Denq,
Chih-Tsun Huang,
Shin-Wei Hung,
Jye-Yuan Lee:
An SOC Test Integration Platform and Its Industrial Realization.
ITC 2004: 1213-1222 |
| 2003 |
| 21 | EE | Kuo-Liang Cheng,
Chih-Wea Wang,
Jih-Nung Lee,
Yung-Fa Chou,
Chih-Tsun Huang,
Cheng-Wen Wu:
FAME: A Fault-Pattern Based Memory Failure Analysis Framework.
ICCAD 2003: 595-598 |
| 20 | EE | Chih-Wea Wang,
Kuo-Liang Cheng,
Jih-Nung Lee,
Yung-Fa Chou,
Chih-Tsun Huang,
Cheng-Wen Wu,
Frank Huang,
Hong-Tzer Yang:
Fault Pattern Oriented Defect Diagnosis for Memories.
ITC 2003: 29-38 |
| 19 | EE | Chih-Wea Wang,
Kuo-Liang Cheng,
Chih-Tsun Huang,
Cheng-Wen Wu:
Test and Diagnosis of Word-Oriented Multiport Memories.
VTS 2003: 248-253 |
| 18 | EE | Chih-Tsun Huang,
Chi-Feng Wu,
Jin-Fu Li,
Cheng-Wen Wu:
Built-in redundancy analysis for memory yield improvement.
IEEE Transactions on Reliability 52(4): 386-399 (2003) |
| 2002 |
| 17 | EE | Chih-Wea Wang,
Jing-Reng Huang,
Yen-Fu Lin,
Kuo-Liang Cheng,
Chih-Tsun Huang,
Cheng-Wen Wu,
Youn-Long Lin:
Test Scheduling of BISTed Memory Cores for SOC.
Asian Test Symposium 2002: 356- |
| 16 | EE | Huan-Shan Hsu,
Jing-Reng Huang,
Kuo-Liang Cheng,
Chih-Wea Wang,
Chih-Tsun Huang,
Cheng-Wen Wu,
Youn-Long Lin:
Test Scheduling and Test Access Architecture Optimization for System-on-Chip.
Asian Test Symposium 2002: 411- |
| 15 | EE | Jen-Chieh Yeh,
Chi-Feng Wu,
Kuo-Liang Cheng,
Yung-Fa Chou,
Chih-Tsun Huang,
Cheng-Wen Wu:
Flash Memory Built-In Self-Test Using March-Like Algorithm.
DELTA 2002: 137-141 |
| 14 | EE | Sau-Kwo Chiu,
Jen-Chieh Yeh,
Chih-Tsun Huang,
Cheng-Wen Wu:
Diagonal Test and Diagnostic Schemes for Flash Memorie.
ITC 2002: 37-46 |
| 13 | EE | Kuo-Liang Cheng,
Jen-Chieh Yeh,
Chih-Wea Wang,
Chih-Tsun Huang,
Cheng-Wen Wu:
RAMSES-FT: A Fault Simulator for Flash Memory Testing and Diagnostics.
VTS 2002: 281-288 |
| 12 | EE | Chi-Feng Wu,
Chih-Tsun Huang,
Kuo-Liang Cheng,
Cheng-Wen Wu:
Fault simulation and test algorithm generation for random accessmemories.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(4): 480-490 (2002) |
| 2001 |
| 11 | EE | Chih-Wea Wang,
Ruey-Shing Tzeng,
Chi-Feng Wu,
Chih-Tsun Huang,
Cheng-Wen Wu,
Shi-Yu Huang,
Shyh-Horng Lin,
Hsin-Po Wang:
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.
Asian Test Symposium 2001: 103- |
| 10 | EE | Kuo-Liang Cheng,
Chia-Ming Hsueh,
Jing-Reng Huang,
Jen-Chieh Yeh,
Chih-Tsun Huang,
Cheng-Wen Wu:
Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip.
Asian Test Symposium 2001: 91-96 |
| 9 | EE | Chi-Feng Wu,
Chih-Tsun Huang,
Kuo-Liang Cheng,
Chih-Wea Wang,
Cheng-Wen Wu:
Simulation-Based Test Algorithm Generation and Port Scheduling for Multi-Port Memories.
DAC 2001: 301-306 |
| 8 | | Jin-Fu Li,
Kuo-Liang Cheng,
Chih-Tsun Huang,
Cheng-Wen Wu:
March-based RAM diagnosis algorithms for stuck-at and coupling faults.
ITC 2001: 758-767 |
| 2000 |
| 7 | EE | Chih-Tsun Huang,
Jing-Reng Huang,
Cheng-Wen Wu:
A programmable built-in self-test core for embedded memories.
ASP-DAC 2000: 11-12 |
| 6 | EE | Chuang Cheng,
Chih-Tsun Huang,
Jing-Reng Huang,
Cheng-Wen Wu,
Chen-Jong Wey,
Ming-Chang Tsai:
BRAINS: A BIST Compiler for Embedded Memories.
DFT 2000: 299- |
| 5 | | Chi-Feng Wu,
Chih-Tsun Huang,
Chih-Wea Wang,
Kuo-Liang Cheng,
Cheng-Wen Wu:
Error Catch and Analysis for Semiconductor Memories Using March Tests.
ICCAD 2000: 468-471 |
| 4 | EE | Chi-Feng Wu,
Chih-Tsun Huang,
Kuo-Liang Cheng,
Cheng-Wen Wu:
Simulation-Based Test Algorithm Generation for Random Access Memories.
VTS 2000: 291-296 |
| 1999 |
| 3 | EE | Chi-Feng Wu,
Chih-Tsun Huang,
Cheng-Wen Wu:
RAMSES: A Fast Memory Fault Simulator.
DFT 1999: 165-173 |
| 2 | EE | Chih-Tsun Huang,
Jing-Reng Huang,
Chi-Feng Wu,
Cheng-Wen Wu,
Tsin-Yuan Chang:
A Programmable BIST Core for Embedded DRAM.
IEEE Design & Test of Computers 16(1): 59-70 (1999) |
| 1997 |
| 1 | EE | Chih-Tsun Huang,
Cheng-Wen Wu:
High-speed C-testable systolic array design for Galois-field inversion.
ED&TC 1997: 342-346 |