| |
| 2005 | ||
|---|---|---|
| 4 | EE | Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra: A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation. J. Electronic Testing 21(5): 503-537 (2005) |
| 2004 | ||
| 3 | EE | Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra: A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool. Asian Test Symposium 2004: 184-189 |
| 2 | EE | Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra: Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits. IOLTS 2004: 184- |
| 1 | EE | Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra: A discrete event systems approach to online testing of digital VLSI circuits. SMC (2) 2004: 1699-1704 |
| 1 | Siddhartha Mukhopadhyay | [1] [2] [3] [4] |
| 2 | Amit Patra | [1] [2] [3] [4] |