| 2008 |
|---|
| 9 | EE | Ganesh Srinivasan,
Friedrich Taenzler,
Abhijit Chatterjee:
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.
IEEE Design & Test of Computers 25(2): 150-159 (2008) |
| 2006 |
|---|
| 8 | EE | Ganesh Srinivasan,
Friedrich Taenzler,
Abhijit Chatterjee:
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.
DATE 2006: 658-663 |
| 7 | EE | Ganesh Srinivasan,
Abhijit Chatterjee,
Friedrich Taenzler:
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.
VTS 2006: 222-227 |
| 2005 |
|---|
| 6 | EE | Achintya Halder,
Soumendu Bhattacharya,
Ganesh Srinivasan,
Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
VLSI Design 2005: 289-294 |
| 5 | EE | Soumendu Bhattacharya,
Achintya Halder,
Ganesh Srinivasan,
Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
J. Electronic Testing 21(3): 323-339 (2005) |
| 2004 |
|---|
| 4 | EE | Ganesh Srinivasan,
Shalabh Goyal,
Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.
Asian Test Symposium 2004: 302-307 |
| 3 | EE | Ganesh Srinivasan,
Soumendu Bhattacharya,
Sasikumar Cherubal,
Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.
DATE 2004: 280-285 |
| 2 | EE | Soumendu Bhattacharya,
Ganesh Srinivasan,
Sasikumar Cherubal,
Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.
DELTA 2004: 372-377 |
| 1 | EE | Soumendu Bhattacharya,
Ganesh Srinivasan,
Sasikumar Cherubal,
Achintya Halder,
Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
VTS 2004: 229-236 |
