| 2008 |
|---|
| 10 | EE | Changhai Zhao,
Haihua Yan,
Xiaohua Shi,
Lei Wang:
DECF: A Coarse-Grained Data-Parallel Programming Framework for Seismic Processing.
CSSE (3) 2008: 454-460 |
| 2007 |
|---|
| 9 | EE | Jianying He,
Haihua Yan,
Mao-zhong Jin,
Chao Liu:
Categorizing Software Engineering Knowledge Using a Combination of SWEBOK and Text Categorization.
Australian Conference on Artificial Intelligence 2007: 675-681 |
| 8 | EE | Anshuman Chandra,
Haihua Yan,
Rohit Kapur:
Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction.
VTS 2007: 84-92 |
| 2006 |
|---|
| 7 | EE | Haihua Yan,
Adit D. Singh:
A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI).
IEEE Trans. VLSI Syst. 14(11): 1216-1226 (2006) |
| 2005 |
|---|
| 6 | EE | Haihua Yan,
Adit D. Singh,
Gefu Xu:
Delay Defect Characterization Using Low Voltage Test.
Asian Test Symposium 2005: 8-13 |
| 5 | EE | Haihua Yan,
Gefu Xu,
Adit D. Singh:
Low Voltage Test in Place of Fast Clock in DDSI Delay Test.
ISQED 2005: 316-320 |
| 4 | EE | Haihua Yan,
Adit D. Singh:
A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects.
VLSI Design 2005: 47-52 |
| 2004 |
|---|
| 3 | EE | Haihua Yan,
Adit D. Singh:
Reduce Yield Loss in Delay Defect Detection in Slack Interval.
Asian Test Symposium 2004: 372-377 |
| 2 | EE | Haihua Yan,
Adit D. Singh:
Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study.
ITC 2004: 242-251 |
| 2003 |
|---|
| 1 | EE | Haihua Yan,
Adit D. Singh:
Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighboring Die.
ITC 2003: 105-111 |
