2008 | ||
---|---|---|
48 | EE | Sunghoon Chun, Taejin Kim, Sungho Kang: A new low energy BIST using a statistical code. ASP-DAC 2008: 647-652 |
47 | EE | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520 |
46 | EE | Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang: An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78 |
45 | EE | Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho Ahn, Sungho Kang: Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor Using Dynamic Voltage Scaling Efficiency Metric. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2088-2092 (2008) |
44 | EE | Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang: A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Transactions 91-C(4): 670-672 (2008) |
43 | EE | Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang: A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Transactions 91-D(4): 1185-1188 (2008) |
42 | EE | DongSup Song, Jin-Ho Ahn, Tae-Jin Kim, Sungho Kang: MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Transactions 91-D(4): 1197-1200 (2008) |
41 | EE | Hong-Sik Kim, Sungho Kang, Michael S. Hsiao: A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing 24(4): 365-378 (2008) |
40 | EE | Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang: An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electronic Testing 24(6): 591-595 (2008) |
2007 | ||
39 | EE | Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang: A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Transactions 90-C(11): 2161-2163 (2007) |
38 | EE | Sunghoon Chun, YongJoon Kim, Sungho Kang: MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electronic Testing 23(4): 357-362 (2007) |
2006 | ||
37 | EE | Jin-Ho Ahn, Hyunjin Kim, Byung In Moon, Sungho Kang: System on a Chip Implementation of Social Insect Behavior for Adaptive Network Routing. ICIC (2) 2006: 530-535 |
36 | EE | Jin-Ho Ahn, Sungho Kang: SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing. ICIC (2) 2006: 655-660 |
35 | EE | Hyuntae Park, Byung In Moon, Sungho Kang: Improved Reinforcement Computing to Implement AntNet-Based Routing Using General NPs for Ubiquitous Environments. ICUCT 2006: 242-251 |
34 | EE | Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang: MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. VLSI Syst. 14(6): 649-654 (2006) |
33 | EE | Hong-Sik Kim, Sungho Kang: Increasing encoding efficiency of LFSR reseeding-based test compression. IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 913-917 (2006) |
32 | EE | DongSup Song, Sungho Kang: A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets. IEICE Transactions 89-D(1): 354-357 (2006) |
31 | EE | Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang: An Efficient Dictionary Organization for Maximum Diagnosis. J. Electronic Testing 22(1): 37-48 (2006) |
2005 | ||
30 | EE | DongSup Song, Sungho Kang: Increasing Embedding Probabilities of RPRPs in RIN Based BIST. Asia-Pacific Computer Systems Architecture Conference 2005: 600-613 |
29 | EE | Jin-Ho Ahn, Byung In Moon, Sungho Kang: A Practical Test Scheduling Using Network-Based TAM in Network on Chip Architecture. Asia-Pacific Computer Systems Architecture Conference 2005: 614-624 |
28 | EE | Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang: A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235 |
27 | EE | Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang: A New Low Power Test Pattern Generator for BIST Architecture. IEICE Transactions 88-C(10): 2037-2038 (2005) |
26 | EE | Junseok Han, DongSup Song, Hagbae Kim, Youngyong Kim, Sungho Kang: An Effective Built-In Self-Test for Chargepump PLL. IEICE Transactions 88-C(8): 1731-1733 (2005) |
2004 | ||
25 | EE | Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang: RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247 |
24 | EE | Jae Seuk Oh, Sung-il Bae, Jin-Ho Ahn, Sungho Kang: Route Reinforcement for Efficient QoS Routing Based on Ant Algorithm. ICOIN 2004: 342-349 |
23 | EE | Byung In Moon, Hongil Yoon, Ilgun Yun, Sungho Kang: An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT 2004: 539-544 |
22 | YongJoon Kim, Hyun-Don Kim, Sungho Kang: A new maximal diagnosis algorithm for interconnect test. IEEE Trans. VLSI Syst. 12(5): 532-537 (2004) | |
2003 | ||
21 | EE | YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang: A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC 2003: 349-357 |
20 | EE | Hong-Sik Kim, YongJoon Kim, Sungho Kang: Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. VLSI Syst. 11(4): 687-690 (2003) |
2002 | ||
19 | EE | Sung-il Bae, Daesik Seo, Gilyoung Kang, Sungho Kang: A New Survival Architecture for Network Processors. AISA 2002: 1-10 |
18 | EE | Sangmin Bae, DongSup Song, Jihye Kim, Sungho Kang: An Efficient On-Line Monitoring BIST for Remote Service System. AISA 2002: 205-214 |
17 | EE | Sungchul Yoon, Sangwook Kim, Jae Seuk Oh, Sungho Kang: A New DSP Architecture for Correcting Errors Using Viterbi Algorithm. AISA 2002: 95-102 |
16 | EE | Hong-Sik Kim, Sungho Kang: DPSC SRAM Transparent Test Algorithm. Asian Test Symposium 2002: 145-150 |
2001 | ||
15 | Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A Heuristic for Multiple Weight Set Generation. ICCD 2001: 513-514 | |
14 | Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A new multiple weight set calculation algorithm. ITC 2001: 878-884 | |
13 | EE | Song Chong, Sangho Lee, Sungho Kang: A simple, scalable, and stable explicit rate allocation algorithm for MAX-MIN flow control with minimum rate guarantee. IEEE/ACM Trans. Netw. 9(3): 322-335 (2001) |
1999 | ||
12 | EE | Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473- |
11 | EE | Hangkyu Lee, Sungho Kang: A New Weight Set Generation Algorithm for Weighted Random Pattern Generation. ICCD 1999: 160-165 |
10 | EE | Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329 |
1997 | ||
9 | Yong Seok Kang, Jong Cheol Lee, Sungho Kang: Built-in Self Test for Contect Addressable Memories. ICCD 1997: 48-53 | |
1996 | ||
8 | EE | Jae-Wook Lee, Sungho Kang: Efficient Simulation Model Generation Using Automatic Programming Techniques. Winter Simulation Conference 1996: 708-713 |
1995 | ||
7 | Youngmin Hur, Stephen A. Szygenda, E. Scott Fehr, Granville E. Ott, Sungho Kang: Massively Parallel Array Processor for Logic, Fault, and Design Error Simulation. HPCA 1995: 340-347 | |
1994 | ||
6 | Sungho Kang, Wai-On Law, Bill Underwood: Path-Delay Fault Simulation for a Standard Scan Design Methodology. ICCD 1994: 359-362 | |
5 | Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk: Fastpath: A Path-Delay Test Generator for Standard Scan Designs. ITC 1994: 154-163 | |
4 | EE | Sungho Kang, Stephen A. Szygenda: Design Validation: Comparing Theoretical and Empirical Results of Design Error Modeling. IEEE Design & Test of Computers 11(1): 18-26 (1994) |
3 | EE | Sungho Kang, Stephen A. Szygenda: The simulation automation system (SAS); concepts, implementation, and results. IEEE Trans. VLSI Syst. 2(1): 89-99 (1994) |
1993 | ||
2 | Sungho Kang, Stephen A. Szygenda: Automatic VHDL Model Generation System. CHDL 1993: 353-360 | |
1992 | ||
1 | Sungho Kang, Stephen A. Szygenda: Modeling and Simulation of Design Errors. ICCD 1992: 443-446 |