Hiroshi Takahashi

2009
48	EE	Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
47	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
2008
46	EE	Yasuo Yamashita, Hiroshi Takahashi, Takao Terano: The Development of the Financial Learning Tool through Business Game. KES (2) 2008: 986-993
45	EE	Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki: Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. IEICE Transactions 91-D(3): 675-682 (2008)
44	EE	Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu: Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools. IEICE Transactions 91-D(3): 690-699 (2008)
43	EE	Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Post-BIST Fault Diagnosis for Multiple Faults. IEICE Transactions 91-D(3): 771-775 (2008)
2007
42	EE	Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu: Timing-Aware Diagnosis for Small Delay Defects. DFT 2007: 223-234
41	EE	Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
40	EE	Hiroshi Takahashi, Takao Terano: Analyzing the Influence of Overconfident Investors on Financial Markets Through Agent-Based Model. IDEAL 2007: 1042-1052
39	EE	Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Analysis of the Relation Between Stock Price Returns and Headline News Using Text Categorization. KES (2) 2007: 1339-1345
38	EE	Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu: Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. VLSI Design 2007: 781-786
2006
37	EE	Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu: Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. ASP-DAC 2006: 659-664
36	EE	Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109
35	EE	Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Analysis of Stock Price Return Using Textual Data and Numerical Data Through Text Mining. KES (2) 2006: 310-316
34	EE	Ikuo Matsuba, Hiroshi Takahashi, Shinya Wakasa: Stochastically Equivalent Dynamical System Approach to Nonlinear Deterministic Prediction. I. J. Bifurcation and Chaos 16(9): 2721-2728 (2006)
2005
33	EE	T. Seiyama, Hiroshi Takahashi, Yoshinobu Higami, Kazuo Yamazaki, Yuzo Takamatsu: On the fault diagnosis in the presence of unknown fault models using pass/fail information. ISCAS (3) 2005: 2987-2990
32	EE	Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Learning Value-Added Information of Asset Management from Analyst Reports Through Text Mining. KES (4) 2005: 785-791
31	EE	Hiroshi Takahashi, Keith J. Keller, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu: A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 252-263 (2005)
30	EE	Akihiko Hirata, Hiroyoshi Togo, Naofumi Shimizu, Hiroshi Takahashi, Katsunari Okamoto, Tadao Nagatsuma: Low-Phase Noise Photonic Millimeter-Wave Generator Using an AWG Integrated with a 3-dB Combiner. IEICE Transactions 88-C(7): 1458-1464 (2005)
2004
29	EE	Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu: Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. Asian Test Symposium 2004: 216-221
28	EE	Yuichi Sato, Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu: Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests. Asian Test Symposium 2004: 222-227
27	EE	Satoru Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: An Efficient Learning System for Knowledge of Asset Management. KES 2004: 494-500
2003
26	EE	Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu: BIST Based Fault Diagnosis Using Ambiguous Test Set. DFT 2003: 89-96
25		Ikuo Matsuba, Hiroshi Takahashi, Shinya Wakasa: Stochastically Equivalent Dynamical System Approach To Nonlinear Deterministic Prediction. HIS 2003: 409-418
24	EE	Hiroshi Takahashi, Takao Terano: Agent-Based Approach to Investors' Behavior and Asset Price Fluctuation in Financial Markets. J. Artificial Societies and Social Simulation 6(3): (2003)
2002
23	EE	Keith J. Keller, Hiroshi Takahashi, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu: Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints. Asian Test Symposium 2002: 242-247
22	EE	Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi: Incremental Diagnosis of Multiple Open-Interconnects. ITC 2002: 1085-1092
21	EE	Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu: An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets. PRDC 2002: 275-282
20	EE	Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu: On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(3): 362-368 (2002)
2001
19	EE	Hiroshi Takahashi, Marong Phadoongsidhi, Yoshinobu Higami, Kewal K. Saluja, Yuzo Takamatsu: Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits. Asian Test Symposium 2001: 63-
18		Keith J. Keller, Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu: On reducing the target fault list of crosstalk-induced delay faults in synchronous sequential circuits. ITC 2001: 568-577
17	EE	Thomas Clouqueur, Ozen Ercevik, Kewal K. Saluja, Hiroshi Takahashi: Efficient Signature-Based Fault Diagnosis Using Variable Size Windows. VLSI Design 2001: 391-396
2000
16	EE	Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu: General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. VTS 2000: 171-178
15	EE	Satoshi Koizumi, Masayuki Matsushita, Yasufumi Takama, Hiroshi Takahashi, Kaoru Hirota: Temporal-Hierarchical Emergency-Degree Inference System for Running Vehicles Using Image and Navigation Data. JACIII 4(1): 76-87 (2000)
1999
14	EE	Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki: Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. Asian Test Symposium 1999: 269-274
13	EE	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida: Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium 1999: 341-346
12	EE	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu: A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. VTS 1999: 64-69
11	EE	Hiroshi Takahashi, Kouichi Kuroda: Study on Intelligent Vehicle Control Considering Driver Perception of Driving Environment. JACIII 3(1): 42-49 (1999)
1998
10	EE	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu: Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. Asian Test Symposium 1998: 108-112
9	EE	Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. Asian Test Symposium 1998: 237-
1997
8	EE	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga: A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. Asian Test Symposium 1997: 320-325
7	EE	Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu: Design of C-Testable Multipliers Based on the Modified Booth Algorithm. Asian Test Symposium 1997: 42-47
6	EE	Hiroshi Takahashi: Vehicle Control Based on Fuzzy Evaluation Knowledge Obtained by Coefficients of the ARMA Model. JACIII 1(1): 8-9 (1997)
5	EE	Hiroshi Takahashi, Takashi Watanabe, Toshiyuki Matsunaga, Yuzo Takamatsu: Tests for small gate delay faults in combinational circuits and a test generation method. Systems and Computers in Japan 28(6): 68-76 (1997)
1996
4		Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs. FTCS 1996: 86-95
1995
3	EE	Hiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu: Generation of tenacious tests for small gate delay faults in combinational circuits. Asian Test Symposium 1995: 332-338
2	EE	Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu: Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. Asian Test Symposium 1995: 58-64
1	EE	Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Multiple Fault Diagnosis by Sensitizing Input Pairs. IEEE Design & Test of Computers 12(3): 44-52 (1995)

Coauthor Index

1	Takashi Aikyo	[36] [41] [42] [43] [45] [47] [48]
2	Hidekazu Ayano	[26]
3	Kwame Osei Boateng	[7] [8] [10] [12] [13] [16] [20]
4	Thomas Clouqueur	[17]
5	Ozen Ercevik	[17]
6	Masaki Hashizume	[41] [47] [48]
7	Yoshinobu Higami	[19] [28] [29] [33] [36] [37] [38] [41] [42] [43] [44] [45] [47] [48]
8	Akihiko Hirata	[30]
9	Kaoru Hirota	[15]
10	Shuhei Kadoyama	[36] [43]
11	Keith J. Keller	[18] [23] [31]
12	Toru Kikkawa	[41]
13	Shin-ya Kobayashi	[37] [44]
14	Satoshi Koizumi	[15]
15	Toshinori Kotake	[14]
16	Kouichi Kuroda	[11]
17	Kim T. Le	[23] [31]
18	Jiang Brandon Liu	[22]
19	Ikuo Matsuba	[25] [34]
20	Toshiyuki Matsunaga	[5] [8]
21	Masayuki Matsushita	[15]
22	Tadao Nagatsuma	[30]
23	Katsunari Okamoto	[30]
24	Kyohei Ono	[42]
25	Junichi Ootsu	[42]
26	Marong Phadoongsidhi	[19]
27	Kewal K. Saluja	[17] [18] [19] [20] [21] [23] [31] [37] [38] [44]
28	Yasuo Sato	[36] [43]
29	Yuichi Sato	[28]
30	T. Seiyama	[33]
31	Naofumi Shimizu	[30]
32	Masakazu Takahashi	[32] [35] [39]
33	Satoru Takahashi	[27] [32] [35] [39]
34	Yasufumi Takama	[15]
35	Yuzo Takamatsu	[1] [2] [3] [4] [5] [7] [8] [9] [10] [12] [13] [16] [18] [19] [20] [21] [23] [26] [28] [29] [31] [33] [36] [37] [38] [41] [42] [43] [44] [45] [47] [48]
36	Takao Terano	[24] [40] [46]
37	Hiroyoshi Togo	[30]
38	Kazuhiko Tsuda	[27] [32] [35] [39]
39	Yasunori Tsugaoka	[26]
40	Toshiyuki Tsutsumi	[47] [48]
41	Andreas G. Veneris	[22]
42	Shinya Wakasa	[25] [34]
43	Takashi Watanabe	[3] [5]
44	Teruhiko Yamada	[14]
45	Yukihiro Yamamoto	[29]
46	Yasuo Yamashita	[46]
47	Kazuo Yamazaki	[33]
48	Koji Yamazaki	[14] [36] [43] [45] [47] [48]
49	Nobuhiro Yanagida	[1] [2] [4] [9] [13]
50	Hiroyuki Yotsuyanagi	[41] [47] [48]

Colors in the list of coauthors