| 2008 |
|---|
| 8 | EE | Sunghoon Chun,
Taejin Kim,
Sungho Kang:
A new low energy BIST using a statistical code.
ASP-DAC 2008: 647-652 |
| 7 | EE | Sunghoon Chun,
Taejin Kim,
YongJoon Kim,
Sungho Kang:
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
VTS 2008: 73-78 |
| 6 | EE | Myung-Hoon Yang,
YongJoon Kim,
Sunghoon Chun,
Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electronic Testing 24(6): 591-595 (2008) |
| 2007 |
|---|
| 5 | EE | Sunghoon Chun,
YongJoon Kim,
Sungho Kang:
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
J. Electronic Testing 23(4): 357-362 (2007) |
| 2006 |
|---|
| 4 | EE | Sunghoon Chun,
YongJoon Kim,
Jung-Been Im,
Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme.
IEEE Trans. VLSI Syst. 14(6): 649-654 (2006) |
| 3 | EE | Sunghoon Chun,
Sangwook Kim,
Hong-Sik Kim,
Sungho Kang:
An Efficient Dictionary Organization for Maximum Diagnosis.
J. Electronic Testing 22(1): 37-48 (2006) |
| 2004 |
|---|
| 2 | EE | Jung-Been Im,
Sunghoon Chun,
Geunbae Kim,
Jin-Ho Ahn,
Sungho Kang:
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test.
Asian Test Symposium 2004: 242-247 |
| 2003 |
|---|
| 1 | EE | YongJoon Kim,
DongSub Song,
YongSeung Shin,
Sunghoon Chun,
Sungho Kang:
A New Maximal Diagnosis Algorithm for Bus-structured Systems.
ITC 2003: 349-357 |
