| 2005 |
|---|
| 6 | EE | Ming Shae Wu,
Chung-Len Lee,
Yeong-Jar Chang,
Wen Ching Wu:
Crosstalk Fault Detection for Interconnection Lines Based on Path Delay Inertia Principle.
Asian Test Symposium 2005: 106-111 |
| 2004 |
|---|
| 5 | EE | Rei-Fu Huang,
Chin-Lung Su,
Cheng-Wen Wu,
Shen-Tien Lin,
Kun-Lun Luo,
Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair.
Asian Test Symposium 2004: 366-371 |
| 4 | EE | Chin-Lung Su,
Rei-Fu Huang,
Cheng-Wen Wu,
Chien-Chung Hung,
Ming-Jer Kao,
Yeong-Jar Chang,
Wen Ching Wu:
MRAM Defect Analysis and Fault Modeli.
ITC 2004: 124-133 |
| 3 | EE | Li-Ming Denq,
Rei-Fu Huang,
Cheng-Wen Wu,
Yeong-Jar Chang,
Wen Ching Wu:
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
MTDT 2004: 65-69 |
| 2000 |
|---|
| 2 | EE | Yeong-Jar Chang,
Chung-Len Lee,
Jwu E. Chen,
Chauchin Su:
A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier.
J. Inf. Sci. Eng. 16(5): 751-766 (2000) |
| 1994 |
|---|
| 1 | | Yeong-Jar Chang,
Chung-Len Lee:
Synthesis of Multi-Variable MVL Funtions Using Hybrid Mode CMOS Logic.
ISMVL 1994: 35-41 |
