| 2007 |
|---|
| 6 | EE | Hyun Choi,
Donghoon Han,
Abhijit Chatterjee:
Enhanced Resolution Jitter Testing Using Jitter Expansion.
VTS 2007: 104-109 |
| 2006 |
|---|
| 5 | EE | Donghoon Han,
Shalabh Goyal,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers.
European Test Symposium 2006: 205-212 |
| 2005 |
|---|
| 4 | EE | Donghoon Han,
Abhijit Chatterjee:
Robust Built-In Test of RF ICs Using Envelope Detectors.
Asian Test Symposium 2005: 2-7 |
| 3 | EE | Donghoon Han,
Selim Sermet Akbay,
Soumendu Bhattacharya,
Abhijit Chatterjee,
William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).
IOLTS 2005: 106-111 |
| 2004 |
|---|
| 2 | EE | Donghoon Han,
Abhijit Chatterjee:
Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study.
Asian Test Symposium 2004: 420-425 |
| 1 | EE | Donghoon Han,
Abhijit Chatterjee:
Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing.
IWSOC 2004: 127-130 |
