| 2006 |
|---|
| 5 | EE | Geewhun Seok,
Il-soo Lee,
Tony Ambler,
B. F. Womack:
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.
DFT 2006: 145-156 |
| 2005 |
|---|
| 4 | EE | Il-soo Lee,
Tony Ambler:
Two efficient methods to reduce power and testing time.
ISLPED 2005: 167-172 |
| 3 | EE | Il-soo Lee,
Jae-Hoon Jeong,
Anthony P. Ambler:
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume.
ISVLSI 2005: 194-199 |
| 2 | EE | Il-soo Lee,
Yu-Ting Lin,
Anthony P. Ambler:
Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set.
ISVLSI 2005: 255-256 |
| 2004 |
|---|
| 1 | EE | Il-soo Lee,
Yong Min Hur,
Tony Ambler:
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.
Asian Test Symposium 2004: 94-97 |
