Yong Min Hur
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2004
1
EE
Il-soo Lee
, Yong Min Hur,
Tony Ambler
: The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.
Asian Test Symposium 2004
: 94-97
Coauthor
Index
1
Tony Ambler
[
1
]
2
Il-soo Lee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
