| |
| 2004 | ||
|---|---|---|
| 1 | EE | Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu: Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. Asian Test Symposium 2004: 216-221 |
| 1 | Yoshinobu Higami | [1] |
| 2 | Hiroshi Takahashi | [1] |
| 3 | Yuzo Takamatsu | [1] |