| 2007 |
|---|
| 4 | EE | Dong Xiang,
Kaiwei Li,
Jiaguang Sun,
Hideo Fujiwara:
Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction.
IEEE Trans. Computers 56(4): 557-562 (2007) |
| 2006 |
|---|
| 3 | EE | Dong Xiang,
Kaiwei Li,
Hideo Fujiwara,
Jiaguang Sun:
Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.
ICCD 2006 |
| 2005 |
|---|
| 2 | EE | Dong Xiang,
Kaiwei Li,
Hideo Fujiwara:
Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops.
Asian Test Symposium 2005: 318-323 |
| 2004 |
|---|
| 1 | EE | Dong Xiang,
Ming-Jing Chen,
Kaiwei Li,
Yu-Liang Wu:
Scan-Based BIST Using an Improved Scan Forest Architecture.
Asian Test Symposium 2004: 88-93 |
