| |
| 2005 | ||
|---|---|---|
| 2 | EE | Erik Larsson, Stina Edbom: Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. VLSI-SoC 2005: 221-244 |
| 2004 | ||
| 1 | EE | Stina Edbom, Erik Larsson: An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. Asian Test Symposium 2004: 254-257 |
| 1 | Erik Larsson | [1] [2] |