| 2006 |
|---|
| 3 | EE | Zhiqiang You,
Tsuyoshi Iwagaki,
Michiko Inoue,
Hideo Fujiwara:
A Low Power Deterministic Test Using Scan Chain Disable Technique.
IEICE Transactions 89-D(6): 1931-1939 (2006) |
| 2005 |
|---|
| 2 | EE | Zhiqiang You,
Ken-ichi Yamaguchi,
Michiko Inoue,
Jacob Savir,
Hideo Fujiwara:
Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths.
IEICE Transactions 88-D(8): 1940-1947 (2005) |
| 2004 |
|---|
| 1 | EE | Zhiqiang You,
Ken-ichi Yamaguchi,
Michiko Inoue,
Jacob Savir,
Hideo Fujiwara:
Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths.
Asian Test Symposium 2004: 32-39 |
