Tomoo Inoue

2008
45	EE	Jonathan E. Leightner, Tomoo Inoue: Capturing climate's effect on pollution abatement with an improved solution to the omitted variables problem. European Journal of Operational Research 191(2): 540-557 (2008)
44	EE	Hideyuki Ichihara, Tomoyuki Saiki, Tomoo Inoue: An Architecture of Embedded Decompressor with Reconfigurability for Test Compression. IEICE Transactions 91-D(3): 713-719 (2008)
43	EE	Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: A Self-Test of Dynamically Reconfigurable Processors with Test Frames. IEICE Transactions 91-D(3): 756-762 (2008)
2007
42	EE	Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara: Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. European Test Symposium 2007: 117-124
41	EE	Ryoko Ishido, Keigo Kitahara, Tomoo Inoue, Ken-ichi Okada: Evaluation of Content Handling Methods for Tabletop Interface. HCI (2) 2007: 326-335
40	EE	Tomoo Inoue, Naoko Yoshimura, Shigeo Sugimoto, Noriko Kando: Usability of a Content Construction System for Collaborative Learning. ICALT 2007: 833-835
39	EE	Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara: TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388
38	EE	Jonathan E. Leightner, Tomoo Inoue: Tackling the omitted variables problem without the strong assumptions of proxies. European Journal of Operational Research 178(3): 819-840 (2007)
37	EE	Hideyuki Ichihara, Toshihiro Ohara, Michihiro Shintani, Tomoo Inoue: A Variable-Length Coding Adjustable for Compressed Test Application. IEICE Transactions 90-D(8): 1235-1242 (2007)
2006
36	EE	Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue: A Reconfigurable Embedded Decompressor for Test Compression. DELTA 2006: 301-308
35	EE	Tomoo Inoue, Keisuke Nakazawa, Yuri Yamamoto, Hiroshi Shigeno, Ken-ichi Okada: Use of human geographic recognition to reduce GPS error in mobile mapmaking learning. ICN/ICONS/MCL 2006: 222
2005
34	EE	Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue: A Huffman-based coding with efficient test application. ASP-DAC 2005: 75-78
33	EE	Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293
32	EE	Tomoo Inoue, Yuri Yamamoto, Keisuke Nakazawa, Hiroshi Shigeno, Ken-ichi Okada: Proposal of a Map-Making System for Mobile Learning that Uses Subjective Geographic Recognition. ICALT 2005: 677-678
31		Yuta Maruyama, Keigo Kitahara, Tomoo Inoue, Hiroshi Shigeno, Ken-ichi Okada: Tangible Collaborative Learning Support System for Spatio-Temporal Contents. ICCE 2005: 799-802
30	EE	Hideyuki Ichihara, Michihiro Shintani, Tomoo Inoue: Huffman-Based Test Response Coding. IEICE Transactions 88-D(1): 158-161 (2005)
2004
29	EE	Debesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara: Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. Asian Test Symposium 2004: 342-347
28	EE	Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue: A Test Decompression Scheme for Variable-Length Coding. Asian Test Symposium 2004: 426-431
2003
27	EE	Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue: Test Response Compression Based on Huffman Coding. Asian Test Symposium 2003: 446-451
26		Shuji Yamamoto, Seiki Hamada, Takeshi Johkoh, Tomoo Inoue, Yasuhiro Tamaki, Sachiko Murai, Noriyuki Tomiyama, Kaname Tomoda, Hironobu Nakamura: Tree-dimensional image processing for breast cancer using multislice CT. CARS 2003: 1312
25	EE	Hideyuki Ichihara, Tomoo Inoue: Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. DATE 2003: 11180-11181
2002
24	EE	Tomoo Inoue, Tomokazu Miura, Akio Tamura, Hideo Fujiwara: A Scheduling Method in High-Level Synthesis for Acyclic Partial Scan Design. Asian Test Symposium 2002: 128-133
23	EE	Hideyuki Ichihara, Tomoo Inoue: Generating Small Test Sets for Test Compression/Decompression Scheme Using Statistical Coding. DELTA 2002: 396-402
22	EE	Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara: Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan 33(10): 105-115 (2002)
2001
21	EE	Hideyuki Ichihara, Atsuhiro Ogawa, Tomoo Inoue, Akio Tamura: Dynamic Test Compression Using Statistical Coding. Asian Test Symposium 2001: 143-
2000
20		Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556
1999
19	EE	Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara: Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192-
18	EE	Tomoya Takasaki, Hideo Fujiwara, Tomoo Inoue: A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure. Asian Test Symposium 1999: 309-314
17	EE	Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Effects of Video Expression in Videoconferencing. HICSS 1999
1998
16		Tomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial Scan Design Methods Based on Internally Balanced Structure. ASP-DAC 1998: 211-216
15	EE	Tomoo Inoue, Toshinori Hosokawa, Takahiro Mihara, Hideo Fujiwara: An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. Asian Test Symposium 1998: 190-197
14	EE	Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: Universal Fault Diagnosis for Lookup Table FPGAs. IEEE Design & Test of Computers 15(1): 39-44 (1998)
13	EE	Hiroshi Youra, Tomoo Inoue, Toshimitsu Masuzawa, Hideo Fujiwara: On the synthesis of synchronizable finite state machines with partial scan. Systems and Computers in Japan 29(1): 53-62 (1998)
12	EE	Tomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial scan design methods based on internally balanced structure. Systems and Computers in Japan 29(10): 26-35 (1998)
1997
11	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
10	EE	Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs. Asian Test Symposium 1997: 276-281
9	EE	Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara: Sequential Test Generation Based on Circuit Pseudo-Transformation. Asian Test Symposium 1997: 62-67
8	EE	Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Integration of face-to-face and video-mediated meetings: HERMES. GROUP 1997: 405-414
1996
7	EE	Tomoo Inoue, Toshimitsu Masuzawa, Hiroshi Youra, Hideo Fujiwara: An Approach To The Synthesis Of Synchronizable Finite State Machines With Partial Scan. Asian Test Symposium 1996: 130-135
6	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
1995
5	EE	Tomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Learning from TV Programs: Application of TV Presentation to a Videoconferencing System. ACM Symposium on User Interface Software and Technology 1995: 147-154
4	EE	Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
3	EE	Tomoo Inoue, Hironori Maeda, Hideo Fujiwara: A scheduling problem in test generation. VTS 1995: 344-349
2	EE	Hideo Fujiwara, Tomoo Inoue: Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System. IEEE Trans. Parallel Distrib. Syst. 6(7): 677-686 (1995)
1990
1	EE	Hideo Fujiwara, Tomoo Inoue: Optimal granularity of test generation in a distributed system. IEEE Trans. on CAD of Integrated Circuits and Systems 9(8): 885-892 (1990)

Coauthor Index

1	Susanta Chakraborty	[29]
2	Debesh Kumar Das (Debesh K. Das)	[20] [29]
3	Takashi Fujii	[42] [43]
4	Hideo Fujiwara	[1] [2] [3] [4] [6] [7] [9] [10] [11] [12] [13] [14] [15] [16] [18] [19] [20] [22] [24] [29] [33] [39]
5	Seiki Hamada	[26]
6	Toshihiro Hiraoka	[19] [22]
7	Toshinori Hosokawa	[15] [19] [22] [33]
8	Hideyuki Ichihara	[21] [23] [25] [27] [28] [30] [33] [34] [36] [37] [39] [42] [43] [44]
9	Ryoko Ishido	[41]
10	Takeshi Johkoh	[26]
11	Noriko Kando	[40]
12	Keigo Kitahara	[31] [41]
13	Jonathan E. Leightner	[38] [45]
14	Hironori Maeda	[3]
15	Yuta Maruyama	[31]
16	Toshimitsu Masuzawa	[7] [13]
17	Yutaka Matsushita	[5] [8] [17]
18	Hiroyuki Michinishi	[4] [6] [11]
19	Takahiro Mihara	[15] [20]
20	Tomokazu Miura	[24]
21	Satoshi Miyazaki	[10] [14]
22	Sachiko Murai	[26]
23	Hironobu Nakamura	[26]
24	Keisuke Nakazawa	[32] [35]
25	Masakuni Ochi	[28]
26	Atsuhiro Ogawa	[21]
27	Toshihiro Ohara	[27] [34] [37]
28	Satoshi Ohtake	[9]
29	Ken-ichi Okada	[5] [8] [17] [31] [32] [35] [41]
30	Naoki Okamoto	[33]
31	Takuji Okamoto	[4] [6] [11]
32	Tomoyuki Saiki	[36] [44]
33	Chiiho Sano	[20]
34	Hiroshi Shigeno	[31] [32] [35]
35	Michihiro Shintani	[27] [28] [30] [34] [37]
36	Akiko Shuto	[39]
37	Shigeo Sugimoto	[40]
38	Tomoya Takasaki	[12] [16] [18]
39	Yasuhiro Tamaki	[26]
40	Akio Tamura	[21] [24]
41	Noriyuki Tomiyama	[26]
42	Kaname Tomoda	[26]
43	Shuji Yamamoto	[26]
44	Yuri Yamamoto	[32] [35]
45	Tokumi Yokohira	[4] [6] [11]
46	Tomokazu Yoneda	[39]
47	Naoko Yoshimura	[40]
48	Hiroshi Youra	[7] [13]

Colors in the list of coauthors