Tomoo Inoue

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

45EEJonathan E. Leightner, Tomoo Inoue: Capturing climate's effect on pollution abatement with an improved solution to the omitted variables problem. European Journal of Operational Research 191(2): 540-557 (2008)
44EEHideyuki Ichihara, Tomoyuki Saiki, Tomoo Inoue: An Architecture of Embedded Decompressor with Reconfigurability for Test Compression. IEICE Transactions 91-D(3): 713-719 (2008)
43EETomoo Inoue, Takashi Fujii, Hideyuki Ichihara: A Self-Test of Dynamically Reconfigurable Processors with Test Frames. IEICE Transactions 91-D(3): 756-762 (2008)
42EETomoo Inoue, Takashi Fujii, Hideyuki Ichihara: Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. European Test Symposium 2007: 117-124
41EERyoko Ishido, Keigo Kitahara, Tomoo Inoue, Ken-ichi Okada: Evaluation of Content Handling Methods for Tabletop Interface. HCI (2) 2007: 326-335
40EETomoo Inoue, Naoko Yoshimura, Shigeo Sugimoto, Noriko Kando: Usability of a Content Construction System for Collaborative Learning. ICALT 2007: 833-835
39EETomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara: TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388
38EEJonathan E. Leightner, Tomoo Inoue: Tackling the omitted variables problem without the strong assumptions of proxies. European Journal of Operational Research 178(3): 819-840 (2007)
37EEHideyuki Ichihara, Toshihiro Ohara, Michihiro Shintani, Tomoo Inoue: A Variable-Length Coding Adjustable for Compressed Test Application. IEICE Transactions 90-D(8): 1235-1242 (2007)
36EETomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue: A Reconfigurable Embedded Decompressor for Test Compression. DELTA 2006: 301-308
35EETomoo Inoue, Keisuke Nakazawa, Yuri Yamamoto, Hiroshi Shigeno, Ken-ichi Okada: Use of human geographic recognition to reduce GPS error in mobile mapmaking learning. ICN/ICONS/MCL 2006: 222
34EEMichihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue: A Huffman-based coding with efficient test application. ASP-DAC 2005: 75-78
33EEHideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293
32EETomoo Inoue, Yuri Yamamoto, Keisuke Nakazawa, Hiroshi Shigeno, Ken-ichi Okada: Proposal of a Map-Making System for Mobile Learning that Uses Subjective Geographic Recognition. ICALT 2005: 677-678
31 Yuta Maruyama, Keigo Kitahara, Tomoo Inoue, Hiroshi Shigeno, Ken-ichi Okada: Tangible Collaborative Learning Support System for Spatio-Temporal Contents. ICCE 2005: 799-802
30EEHideyuki Ichihara, Michihiro Shintani, Tomoo Inoue: Huffman-Based Test Response Coding. IEICE Transactions 88-D(1): 158-161 (2005)
29EEDebesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara: Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. Asian Test Symposium 2004: 342-347
28EEHideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue: A Test Decompression Scheme for Variable-Length Coding. Asian Test Symposium 2004: 426-431
27EEHideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue: Test Response Compression Based on Huffman Coding. Asian Test Symposium 2003: 446-451
26 Shuji Yamamoto, Seiki Hamada, Takeshi Johkoh, Tomoo Inoue, Yasuhiro Tamaki, Sachiko Murai, Noriyuki Tomiyama, Kaname Tomoda, Hironobu Nakamura: Tree-dimensional image processing for breast cancer using multislice CT. CARS 2003: 1312
25EEHideyuki Ichihara, Tomoo Inoue: Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. DATE 2003: 11180-11181
24EETomoo Inoue, Tomokazu Miura, Akio Tamura, Hideo Fujiwara: A Scheduling Method in High-Level Synthesis for Acyclic Partial Scan Design. Asian Test Symposium 2002: 128-133
23EEHideyuki Ichihara, Tomoo Inoue: Generating Small Test Sets for Test Compression/Decompression Scheme Using Statistical Coding. DELTA 2002: 396-402
22EEToshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara: Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan 33(10): 105-115 (2002)
21EEHideyuki Ichihara, Atsuhiro Ogawa, Tomoo Inoue, Akio Tamura: Dynamic Test Compression Using Statistical Coding. Asian Test Symposium 2001: 143-
20 Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556
19EEToshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara: Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192-
18EETomoya Takasaki, Hideo Fujiwara, Tomoo Inoue: A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure. Asian Test Symposium 1999: 309-314
17EETomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Effects of Video Expression in Videoconferencing. HICSS 1999
16 Tomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial Scan Design Methods Based on Internally Balanced Structure. ASP-DAC 1998: 211-216
15EETomoo Inoue, Toshinori Hosokawa, Takahiro Mihara, Hideo Fujiwara: An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. Asian Test Symposium 1998: 190-197
14EETomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: Universal Fault Diagnosis for Lookup Table FPGAs. IEEE Design & Test of Computers 15(1): 39-44 (1998)
13EEHiroshi Youra, Tomoo Inoue, Toshimitsu Masuzawa, Hideo Fujiwara: On the synthesis of synchronizable finite state machines with partial scan. Systems and Computers in Japan 29(1): 53-62 (1998)
12EETomoya Takasaki, Tomoo Inoue, Hideo Fujiwara: Partial scan design methods based on internally balanced structure. Systems and Computers in Japan 29(10): 26-35 (1998)
11EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
10EETomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara: On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs. Asian Test Symposium 1997: 276-281
9EESatoshi Ohtake, Tomoo Inoue, Hideo Fujiwara: Sequential Test Generation Based on Circuit Pseudo-Transformation. Asian Test Symposium 1997: 62-67
8EETomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Integration of face-to-face and video-mediated meetings: HERMES. GROUP 1997: 405-414
7EETomoo Inoue, Toshimitsu Masuzawa, Hiroshi Youra, Hideo Fujiwara: An Approach To The Synthesis Of Synchronizable Finite State Machines With Partial Scan. Asian Test Symposium 1996: 130-135
6EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
5EETomoo Inoue, Ken-ichi Okada, Yutaka Matsushita: Learning from TV Programs: Application of TV Presentation to a Videoconferencing System. ACM Symposium on User Interface Software and Technology 1995: 147-154
4EETomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
3EETomoo Inoue, Hironori Maeda, Hideo Fujiwara: A scheduling problem in test generation. VTS 1995: 344-349
2EEHideo Fujiwara, Tomoo Inoue: Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System. IEEE Trans. Parallel Distrib. Syst. 6(7): 677-686 (1995)
1EEHideo Fujiwara, Tomoo Inoue: Optimal granularity of test generation in a distributed system. IEEE Trans. on CAD of Integrated Circuits and Systems 9(8): 885-892 (1990)

Coauthor Index

1Susanta Chakraborty [29]
2Debesh Kumar Das (Debesh K. Das) [20] [29]
3Takashi Fujii [42] [43]
4Hideo Fujiwara [1] [2] [3] [4] [6] [7] [9] [10] [11] [12] [13] [14] [15] [16] [18] [19] [20] [22] [24] [29] [33] [39]
5Seiki Hamada [26]
6Toshihiro Hiraoka [19] [22]
7Toshinori Hosokawa [15] [19] [22] [33]
8Hideyuki Ichihara [21] [23] [25] [27] [28] [30] [33] [34] [36] [37] [39] [42] [43] [44]
9Ryoko Ishido [41]
10Takeshi Johkoh [26]
11Noriko Kando [40]
12Keigo Kitahara [31] [41]
13Jonathan E. Leightner [38] [45]
14Hironori Maeda [3]
15Yuta Maruyama [31]
16Toshimitsu Masuzawa [7] [13]
17Yutaka Matsushita [5] [8] [17]
18Hiroyuki Michinishi [4] [6] [11]
19Takahiro Mihara [15] [20]
20Tomokazu Miura [24]
21Satoshi Miyazaki [10] [14]
22Sachiko Murai [26]
23Hironobu Nakamura [26]
24Keisuke Nakazawa [32] [35]
25Masakuni Ochi [28]
26Atsuhiro Ogawa [21]
27Toshihiro Ohara [27] [34] [37]
28Satoshi Ohtake [9]
29Ken-ichi Okada [5] [8] [17] [31] [32] [35] [41]
30Naoki Okamoto [33]
31Takuji Okamoto [4] [6] [11]
32Tomoyuki Saiki [36] [44]
33Chiiho Sano [20]
34Hiroshi Shigeno [31] [32] [35]
35Michihiro Shintani [27] [28] [30] [34] [37]
36Akiko Shuto [39]
37Shigeo Sugimoto [40]
38Tomoya Takasaki [12] [16] [18]
39Yasuhiro Tamaki [26]
40Akio Tamura [21] [24]
41Noriyuki Tomiyama [26]
42Kaname Tomoda [26]
43Shuji Yamamoto [26]
44Yuri Yamamoto [32] [35]
45Tokumi Yokohira [4] [6] [11]
46Tomokazu Yoneda [39]
47Naoko Yoshimura [40]
48Hiroshi Youra [7] [13]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)