John Delos Reyes

2004
2	EE	Said Hamdioui, John Delos Reyes, Zaid Al-Ars: Evaluation of Intra-Word Faults in Word-Oriented RAMs. Asian Test Symposium 2004: 283-288
1	EE	Said Hamdioui, Rob Wadsworth, John Delos Reyes, A. J. van de Goor: Memory Fault Modeling Trends: A Case Study. J. Electronic Testing 20(3): 245-255 (2004)

Coauthor Index

1	Zaid Al-Ars	[2]
2	A. J. van de Goor	[1]
3	Said Hamdioui	[1] [2]
4	Rob Wadsworth	[1]