K. W. Lai
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2004
1
EE
S. Ghosh
, K. W. Lai,
Wen-Ben Jone
,
Shih-Chieh Chang
: Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits.
Asian Test Symposium 2004
: 210-215
Coauthor
Index
1
Shih-Chieh Chang
[
1
]
2
S. Ghosh
[
1
]
3
Wen-Ben Jone
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
