| 2008 |
| 9 | EE | Luis A. Plana,
John Bainbridge,
Steve Furber,
Sean Salisbury,
Yebin Shi,
Jian Wu:
An On-Chip and Inter-Chip Communications Network for the SpiNNaker Massively-Parallel Neural Net Simulator.
NOCS 2008: 215-216 |
| 2007 |
| 8 | EE | Andrew M. Scott,
Mark E. Schuelein,
Marly Roncken,
Jin-Jer Hwan,
John Bainbridge,
John R. Mawer,
David L. Jackson,
Andrew Bardsley:
Asynchronous on-Chip Communication: Explorations on the Intel PXA27x Processor Peripheral Bus.
ASYNC 2007: 60-72 |
| 2005 |
| 7 | EE | Aristides Efthymiou,
John Bainbridge,
Douglas A. Edwards:
Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.
IEEE Trans. VLSI Syst. 13(12): 1384-1393 (2005) |
| 2004 |
| 6 | EE | Aristides Efthymiou,
John Bainbridge,
Douglas A. Edwards:
Adding Testability to an Asynchronous Interconnect for GALS SoC.
Asian Test Symposium 2004: 20-23 |
| 5 | EE | Stephen B. Furber,
John Bainbridge,
J. Mike Cumpstey,
Steve Temple:
Sparse distributed memory using N-of-M codes.
Neural Networks 17(10): 1437-1451 (2004) |
| 2002 |
| 4 | EE | John Bainbridge,
Stephen B. Furber:
Chain: A Delay-Insensitive Chip Area Interconnect.
IEEE Micro 22(5): 16-23 (2002) |
| 1994 |
| 3 | | John Bainbridge:
Defining Testability Metrics Axiomatically.
Softw. Test., Verif. Reliab. 4(2): 63-80 (1994) |
| 1992 |
| 2 | | John Bainbridge:
A Heuristic Method for Generating Large Random Expressions.
Inf. Process. Lett. 44(3): 165-170 (1992) |
| 1990 |
| 1 | | John Bainbridge,
R. W. Whitty,
John Wordsworth:
Obtaining Structural Metrics of Z Specifications for Systems Development.
Z User Workshop 1990: 269-281 |