Gert Jervan

2008
13	EE	Raimund Ubar, Sergei Devadze, Maksim Jenihhin, Jaan Raik, Gert Jervan, Peeter Ellervee: Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance. DELTA 2008: 222-227
12	EE	Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar: Hybrid BIST optimization using reseeding and test set compaction. Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 254-262 (2008)
2007
11	EE	Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar: Hybrid BIST Optimization Using Reseeding and Test Set Compaction. DSD 2007: 596-603
10	EE	Gert Jervan, Helena Kruus, Elmet Orasson, Raimund Ubar: Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. SIES 2007: 71-77
2006
9		Gert Jervan, Anton Arhipov, Peeter Ellervee: Work in Progress: FPGA Based Emulation Environment. ReCoSoC 2006: 146-151
8	EE	Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin: Test Time Minimization for Hybrid BIST of Core-Based Systems. J. Comput. Sci. Technol. 21(6): 907-912 (2006)
2005
7	EE	Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles: Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment. DSD 2005: 83-87
2004
6	EE	Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles: Hybrid BIST Test Scheduling Based on Defect Probabilities. Asian Test Symposium 2004: 230-235
2003
5	EE	Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin: Test Time Minimization for Hybrid BIST of Core-Based Systems. Asian Test Symposium 2003: 318-325
4	EE	Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin: Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture. DFT 2003: 225-
2002
3	EE	Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus: A Hybrid BIST Architecture and Its Optimization for SoC Testing. ISQED 2002: 273-279
2001
2	EE	Elmet Orasson, Rein Raidma, Raimund Ubar, Gert Jervan, Zebo Peng: Fast Test Cost Calculation for Hybrid BIST in Digital Systems. DSD 2001: 318-325
2000
1	EE	Gert Jervan, Zebo Peng, Raimund Ubar: Test Cost Minimization for Hybrid Bist. DFT 2000: 283-291

Coauthor Index

1	Anton Arhipov	[9]
2	Sergei Devadze	[13]
3	Petru Eles	[4] [5] [6] [7] [8]
4	Peeter Ellervee	[9] [13]
5	Zhiyuan He	[6] [7]
6	Maksim Jenihhin	[4] [5] [8] [13]
7	Helena Kruus	[3] [10] [11] [12]
8	Elmet Orasson	[2] [10] [11] [12]
9	Zebo Peng	[1] [2] [3] [4] [5] [6] [7] [8]
10	Rein Raidma	[2]
11	Jaan Raik	[13]
12	Raimund Ubar	[1] [2] [3] [4] [5] [8] [10] [11] [12] [13]