| 2005 |
|---|
| 4 | EE | Dong Xiang,
Ming-Jing Chen,
Hideo Fujiwara:
Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST.
Asian Test Symposium 2005: 126-131 |
| 3 | EE | Dong Xiang,
Ming-Jing Chen,
Jia-Guang Sun,
Hideo Fujiwara:
Improving test effectiveness of scan-based BIST by scan chain partitioning.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(6): 916-927 (2005) |
| 2004 |
|---|
| 2 | EE | Dong Xiang,
Ming-Jing Chen,
Kaiwei Li,
Yu-Liang Wu:
Scan-Based BIST Using an Improved Scan Forest Architecture.
Asian Test Symposium 2004: 88-93 |
| 2003 |
|---|
| 1 | EE | Dong Xiang,
Ming-Jing Chen,
Jia-Guang Sun,
Hideo Fujiwara:
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.
Asian Test Symposium 2003: 12-17 |
