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VTS 1996: Princeton, NJ, USA

14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA. IEEE Computer Society 1996 BibTeX

Design for Testability

Testability of Analog Circuits

Synthesis for Testability

IDDQ Testing

On-Line Testing

Fault Diagnosis and Dictionaries

Panel Session

Sequential Circuit Testing

Multi-Chip Modules and Memory Testing

Delay Fault Testing

Non-Traditional Testing

Panel Session

Advances in Built-In Self-Test

Fault Modeling and Defect Coverage

Fault Simulation and Test Generation

Mixed-Signal Test Techniques

Panel Session

Copyright © Sat May 16 23:47:02 2009 by Michael Ley (ley@uni-trier.de)