Charles E. Stroud

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51 Bradley F. Dutton, Charles E. Stroud: Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs. CATA 2009: 57-62
50 Brooks R. Garrison, Daniel T. Milton, Charles E. Stroud: Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays. CATA 2009: 63-68
49EELaung-Terng Wang, Charles E. Stroud, Kwang-Ting (Tim) Cheng: Logic Testing. Wiley Encyclopedia of Computer Science and Engineering 2008
48EEJie Qin, Charles E. Stroud, Foster F. Dai: Noise Figure Measurement Using Mixed-Signal BIST. ISCAS 2007: 2180-2183
47EEJohn M. Emmert, Charles E. Stroud, Miron Abramovici: Online Fault Tolerance for FPGA Logic Blocks. IEEE Trans. VLSI Syst. 15(2): 216-226 (2007)
46 Lee Lerner, Charles E. Stroud: An Architecture for Fail-Silent Operation of FPGAs and Configurable SoCs. ESA 2006: 176-182
45 Daniel Milton, Sachin Dhingra, Charles E. Stroud: Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs. ESA 2006: 87-93
44EECharles E. Stroud, Dayu Yang, Foster F. Dai: Analog frequency response measurement in mixed-signal systems. ISCAS 2006
43EEFoster F. Dai, Charles E. Stroud, Dayu Yang: Automatic linearity and frequency response tests with built-in pattern generator and analyzer. IEEE Trans. VLSI Syst. 14(6): 561-572 (2006)
42EEJack Smith, Tian Xia, Charles E. Stroud: An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults. J. Electronic Testing 22(3): 239-253 (2006)
41 Charles E. Stroud, Srinivas M. Garimella, John Sunwoo: On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. Computers and Their Applications 2005: 308-313
40 Srinivas M. Garimella, Charles E. Stroud: Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs. ESA 2005: 130-136
39EEDayu Yang, Foster F. Dai, Charles E. Stroud: Built-in self-test for automatic analog frequency response measurement. ISCAS (3) 2005: 2208-2211
38EEFoster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi: Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer. ITC 2004: 271-280
37EECharles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris: Built-In Self-Test for System-on-Chip: A Case Study. ITC 2004: 837-846
36EEMiron Abramovici, Charles E. Stroud, John M. Emmert: Online BIST and BIST-based diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 12(12): 1284-1294 (2004)
35EECharles E. Stroud, Keshia N. Leach, Thomas A. Slaughter: BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. ITC 2003: 1258-1267
34EEMiron Abramovici, Charles E. Stroud: BIST-Based Delay-Fault Testing in FPGAs. J. Electronic Testing 19(5): 549-558 (2003)
33EEMiron Abramovici, Charles E. Stroud, Marty Emmert: Using embedded FPGAs for SoC yield improvement. DAC 2002: 713-724
32EEMiron Abramovici, Charles E. Stroud: BIST-Based Delay-Fault Testing in FPGAs. IOLTW 2002: 131-134
31EECharles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici: BIST-Based Diagnosis of FPGA Interconnect. ITC 2002: 618-627
30EEJohn M. Emmert, Stanley Baumgart, Pankaj Kataria, Andrew M. Taylor, Charles E. Stroud, Miron Abramovici: On-Line Fault Tolerance for FPGA Interconnect with Roving STARs. DFT 2001: 445-454
29EEMiron Abramovici, John M. Emmert, Charles E. Stroud: Roving Stars: An Integrated Approach To On-Line Testing, Diagnosis, And Fault Tolerance For Fpgas In Adaptive Computing Systems. Evolvable Hardware 2001: 73-92
28EEMiron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John M. Emmert: On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. IOLTW 2001: 27-33
27EEHenry Chang, Steve Dollens, Gordon Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham: Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? VTS 2001: 415-416
26EEMiron Abramovici, Charles E. Stroud: BIST-based test and diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 9(1): 159-172 (2001)
25EEJohn M. Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici: Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. FCCM 2000: 165-174
24EEJohn M. Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici: Performance Penalty for Fault Tolerance in Roving STARs. FPL 2000: 545-554
23EEMiron Abramovici, Charles E. Stroud, Brandon Skaggs, John M. Emmert: Improving On-Line BIST-Based Diagnosis for Roving STARs. IOLTW 2000: 31-39
22 Charles E. Stroud, John M. Emmert, John R. Bailey, Khushru S. Chhor, Dragan Nikolic: Bridging fault extraction from physical design data for manufacturing test development. ITC 2000: 760-769
21 Miron Abramovici, Charles E. Stroud: DIST-based detection and diagnosis of multiple faults in FPGAs. ITC 2000: 785-794
20EECharles E. Stroud, James R. Bailey, Johan R. Emmert: A New Method for Testing Re-Programmable PLAs. J. Electronic Testing 16(6): 635-640 (2000)
19 Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma: Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. ITC 1999: 973-982
18EECarter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud: Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access. VTS 1999: 413-419
17EECharles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici: Built-in self-test of FPGA interconnect. ITC 1998: 404-411
16EECharles E. Stroud, Joe K. Tannehill Jr.: Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits. VTS 1998: 303-308
15 Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, S. Roy, S. Wu: A Parameterized VHDL Library for On-Line Testing. ITC 1997: 479-488
14 Charles E. Stroud, Eric Lee, Miron Abramovici: BIST-Based Diagnostics of FPGA Logic Blocks. ITC 1997: 539-547
13EECharles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici: Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. FPGA 1996: 107-113
12 Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici: Using ILA Testing for BIST in FPGAs. ITC 1996: 68-75
11EECharles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici: Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). VTS 1996: 387-392
10EET. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud: A built-in self test scheme for VLSI. ASP-DAC 1995
9EECharles E. Stroud, T. Raju Damarla: Improving the efficiency of error identification via signature analysis. VTS 1995: 244-249
8EET. Raju Damarla, Charles E. Stroud, Avinash Sathaye: Multiple error detection and identification via signature analysis. J. Electronic Testing 7(3): 193-207 (1995)
7EECharles E. Stroud: Reliability of majority voting based VLSI fault-tolerant circuits. IEEE Trans. VLSI Syst. 2(4): 516-521 (1994)
6EECharles E. Stroud, Ahmed E. Barbour: Testability and test generation for majority voting fault-tolerant circuits. J. Electronic Testing 4(3): 201-214 (1993)
5 Charles E. Stroud: Distractions in Design for Testability and Built-Is Self-Test. ITC 1991: 1112
4 Charles E. Stroud: Built-In Self-Test for High-Speed Data-Path Circuitry. ITC 1991: 47-56
3 Charles E. Stroud, Ahmed E. Barbour: Parallel Processing and Hardware Acceleration for Synthesis of VLSI Devices from Behavioral Models. ICPP (1) 1990: 470-473
2 Charles E. Stroud, Ahmed E. Barbour: Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits. ITC 1989: 812-818
1EECharles E. Stroud: An Automated BIST Approach for General Sequential Logic Synthesis. DAC 1988: 3-8

Coauthor Index

1Jacob A. Abraham [27]
2Miron Abramovici [11] [12] [13] [14] [17] [19] [21] [23] [24] [25] [26] [28] [29] [30] [31] [32] [33] [34] [36] [47]
3James R. Bailey [20]
4John R. Bailey [22]
5Ahmed E. Barbour [2] [3] [6]
6Stanley Baumgart [30]
7Henry Chang [27]
8Jason A. Cheatham [24]
9Ping Chen [11] [13]
10Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng) [49]
11Khushru S. Chhor [22]
12Moon J. Chung [10]
13Foster F. Dai [38] [39] [43] [44] [48]
14T. Raju Damarla [8] [9] [10]
15Sachin Dhingra [45]
16M. Ding [15]
17Steve Dollens [27]
18Bradley F. Dutton [51]
19Johan R. Emmert [20]
20John M. Emmert [22] [23] [24] [25] [28] [29] [30] [36] [47]
21Marty Emmert [33]
22Srinivas M. Garimella [37] [40] [41]
23Brooks R. Garrison [50]
24Gretchen Gibson [18]
25Carter Hamilton [17] [18] [19]
26Jonathan Harris [37]
27Ramesh Karri [15]
28Pankaj Kataria [24] [30]
29I. Kim [15]
30Srinivasa Konala [11] [12] [13]
31Matthew Lashinsky [28] [31]
32Keshia N. Leach [35]
33Eric Lee [12] [14]
34Lee Lerner [46]
35Gerald T. Michael [10]
36Daniel Milton [45]
37Daniel T. Milton [50]
38Jeremy Nall [28] [31]
39Dragan Nikolic [22]
40Shuying Qi [38]
41Jie Qin [48]
42Gordon Roberts [27]
43S. Roy [15]
44Avinash Sathaye [8]
45S. Seshadri [15]
46Brandon Skaggs [23] [25]
47Thomas A. Slaughter [35]
48Jack Smith [42]
49Mani Soma [27]
50Wei Su [10]
51John Sunwoo [37] [41]
52Joe K. Tannehill Jr. [16]
53Andrew M. Taylor [24] [30]
54Vinay Verma [19]
55Laung-Terng Wang [49]
56Sajitha Wijesuriya [17] [18] [19]
57S. Wu [15]
58Tian Xia [42]
59Dayu Yang [38] [39] [43] [44]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)