| 1998 |
|---|
| 6 | EE | Jonathan T.-Y. Chang,
Chao-Wen Tseng,
Chien-Mo James Li,
Mike Purtell,
Edward J. McCluskey:
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.
ITC 1998: 184-193 |
| 5 | EE | Jonathan T.-Y. Chang,
Edward J. McCluskey:
Detecting resistive shorts for CMOS domino circuits.
ITC 1998: 890-899 |
| 4 | EE | Jonathan T.-Y. Chang,
Chao-Wen Tseng,
Yi-Chin Chu,
Sanjay Wattal,
Mike Purtell,
Edward J. McCluskey:
Experimental Results for IDDQ and VLV Testing.
VTS 1998: 118-125 |
| 1997 |
|---|
| 3 | EE | Jonathan T.-Y. Chang,
Edward J. McCluskey:
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs.
VTS 1997: 446- |
| 1996 |
|---|
| 2 | | Jonathan T.-Y. Chang,
Edward J. McCluskey:
Detecting Delay Flaws by Very-Low-Voltage Testing.
ITC 1996: 367-376 |
| 1 | EE | Jonathan T.-Y. Chang,
Edward J. McCluskey:
Quantitative analysis of very-low-voltage testing.
VTS 1996: 332-337 |
