| |
| 1996 | ||
|---|---|---|
| 1 | EE | S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301 |
| 1 | Christophe Fagot | [1] |
| 2 | Patrick Girard | [1] |
| 3 | Christian Landrault | [1] |
| 4 | Serge Pravossoudovitch | [1] |