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S. Cremoux

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1996
1EES. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301

Coauthor Index

1Christophe Fagot [1]
2Patrick Girard [1]
3Christian Landrault [1]
4Serge Pravossoudovitch [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)