Krishna B. Rajan

1996
2	EE	Krishna B. Rajan, David E. Long, Miron Abramovici: Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230
1992
1	EE	Miron Abramovici, Krishna B. Rajan, David T. Miller: Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25

Coauthor Index

1	Miron Abramovici	[1] [2]
2	David E. Long	[2]
3	David T. Miller	[1]