| 2004 |
|---|
| 9 | | A. Morozov,
Michael Gössel,
V. V. Saposhnikov,
Vl. V. Saposhnikov:
Complementary Circuits for On-Line Detection for 1-out-of-3 Codes.
ARCS Workshops 2004: 76-83 |
| 8 | EE | V. V. Saposhnikov,
Vl. V. Saposhnikov,
A. Morozov,
Michael Gössel:
Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits.
IOLTS 2004: 25-30 |
| 2000 |
|---|
| 7 | EE | Vitalij Ocheretnij,
Michael Gössel,
Vl. V. Saposhnikov,
V. V. Saposhnikov:
A New Method of Redundancy Addition for Circuit Optimization.
EUROMICRO 2000: 1172- |
| 6 | EE | A. Morozov,
V. V. Saposhnikov,
Vl. V. Saposhnikov,
Michael Gössel:
New Self-Checking Circuits by Use of Berger-Codes.
IOLTW 2000: 141-146 |
| 5 | EE | Michael Gössel,
Alexej Dmitriev,
Vl. V. Saposhnikov,
V. V. Saposhnikov:
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.
IOLTW 2000: 147-152 |
| 1999 |
|---|
| 4 | EE | Vl. V. Saposhnikov,
V. Moshanin,
V. V. Saposhnikov,
Michael Gössel:
Experimental Results for Self-Dual Multi-Output Combinational Circuits.
J. Electronic Testing 14(3): 295-300 (1999) |
| 1998 |
|---|
| 3 | EE | Vl. V. Saposhnikov,
V. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel:
Self-Dual Duplication for Error Detection.
Asian Test Symposium 1998: 296-300 |
| 2 | EE | V. V. Saposhnikov,
A. A. Morosov,
Vl. V. Saposhnikov,
Michael Gössel:
A New Design Method for Self-Checking Unidirectional Combinational Circuits.
J. Electronic Testing 12(1-2): 41-53 (1998) |
| 1996 |
|---|
| 1 | EE | Vl. V. Saposhnikov,
Alexej Dmitriev,
Michael Gössel,
V. V. Saposhnikov:
Self-dual parity checking-A new method for on-line testing.
VTS 1996: 162-168 |
