| 2009 |
|---|
| 66 | EE | George Xenoulis,
Dimitris Gizopoulos,
Mihalis Psarakis,
Antonis M. Paschalis:
Instruction-Based Online Periodic Self-Testing of Microprocessors with Floating-Point Units.
IEEE Trans. Dependable Sec. Comput. 6(2): 124-134 (2009) |
| 2008 |
|---|
| 65 | EE | A. Apostolakis,
Dimitris Gizopoulos,
Mihalis Psarakis,
Antonis M. Paschalis:
Functional Self-Testing for Bus-Based Symmetric Multiprocessors.
DATE 2008: 1304-1309 |
| 64 | EE | Nektarios Kranitis,
Andreas Merentitis,
George Theodorou,
Antonis M. Paschalis,
Dimitris Gizopoulos:
Hybrid-SBST Methodology for Efficient Testing of Processor Cores.
IEEE Design & Test of Computers 25(1): 64-75 (2008) |
| 63 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Constantin Halatsis,
Frosso S. Makri,
Miltiadis Hatzimihail:
An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set.
IEEE Trans. Computers 57(8): 1012-1022 (2008) |
| 62 | EE | Dimitris Gizopoulos,
Mihalis Psarakis,
Miltiadis Hatzimihail,
M. Maniatakos,
Antonis M. Paschalis,
Anand Raghunathan,
Srivaths Ravi:
Systematic Software-Based Self-Test for Pipelined Processors.
IEEE Trans. VLSI Syst. 16(11): 1441-1453 (2008) |
| 2007 |
|---|
| 61 | EE | George Xenoulis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
On-Line Periodic Self-Testing of High-Speed Floating-Point Units in Microprocessors.
DFT 2007: 379-387 |
| 60 | EE | Andreas Merentitis,
Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos:
Selecting Power-Optimal SBST Routines for On-Line Processor Testing.
European Test Symposium 2007: 111-116 |
| 59 | EE | A. Apostolakis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs.
IOLTS 2007: 271-276 |
| 58 | EE | A. Apostolakis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Functional Processor-Based Testing of Communication Peripherals in Systems-on-Chip.
IEEE Trans. VLSI Syst. 15(8): 971-975 (2007) |
| 2006 |
|---|
| 57 | EE | Mihalis Psarakis,
Dimitris Gizopoulos,
Miltiadis Hatzimihail,
Antonis M. Paschalis,
Anand Raghunathan,
Srivaths Ravi:
Systematic software-based self-test for pipelined processors.
DAC 2006: 393-398 |
| 56 | EE | Nektarios Kranitis,
Andreas Merentitis,
N. Laoutaris,
George Theodorou,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Constantin Halatsis:
Optimal periodic testing of intermittent faults in embedded pipelined processor applications.
DATE 2006: 65-70 |
| 55 | EE | P. Kenterlis,
Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Mihalis Psarakis:
A Low-Cost SEU Fault Emulation Platform for SRAM-Based FPGAs.
IOLTS 2006: 235-241 |
| 54 | EE | George Xenoulis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units.
IEEE Trans. Computers 55(11): 1449-1457 (2006) |
| 2005 |
|---|
| 53 | EE | Miltiadis Hatzimihail,
Mihalis Psarakis,
George Xenoulis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Software-Based Self-Test for Pipelined Processors: A Case Study.
DFT 2005: 535-543 |
| 52 | EE | Ioannis Voyiatzis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Accumulator-Based Weighted Pattern Generation.
IOLTS 2005: 215-220 |
| 51 | EE | George Xenoulis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Test Generation Methodology for High-Speed Floating Point Adders.
IOLTS 2005: 227-232 |
| 50 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
George Xenoulis:
Software-Based Self-Testing of Embedded Processors.
IEEE Trans. Computers 54(4): 461-475 (2005) |
| 49 | EE | Ioannis Voyiatzis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.
IEEE Trans. VLSI Syst. 13(9): 1079-1086 (2005) |
| 48 | EE | Antonis M. Paschalis,
Dimitris Gizopoulos:
Effective software-based self-test strategies for on-line periodic testing of embedded processors.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(1): 88-99 (2005) |
| 47 | EE | Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Built-in sequential fault self-testing of array multipliers.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 449-460 (2005) |
| 46 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Constantin Halatsis:
A concurrent built-in self-test architecture based on a self-testing RAM.
IEEE Transactions on Reliability 54(1): 69-78 (2005) |
| 2004 |
|---|
| 45 | EE | Antonis M. Paschalis,
Dimitris Gizopoulos:
Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors.
DATE 2004: 578-583 |
| 2003 |
|---|
| 44 | EE | Nektarios Kranitis,
George Xenoulis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
Low-Cost Software-Based Self-Testing of RISC Processor Cores.
DATE 2003: 10714-10719 |
| 43 | EE | George Xenoulis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Antonis M. Paschalis:
Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores.
IOLTS 2003: 149- |
| 42 | EE | Nektarios Kranitis,
George Xenoulis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores.
ITC 2003: 431-440 |
| 41 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Instruction-Based Self-Testing of Processor Cores.
J. Electronic Testing 19(2): 103-112 (2003) |
| 40 | EE | Dimitris Gizopoulos,
Mihalis Psarakis,
Antonis M. Paschalis,
Yervant Zorian:
Easily Testable Cellular Carry Lookahead Adders.
J. Electronic Testing 19(3): 285-298 (2003) |
| 2002 |
|---|
| 39 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Effective Software Self-Test Methodology for Processor Cores.
DATE 2002: 592-597 |
| 38 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
Instruction-Based Self-Testing of Processor Cores.
VTS 2002: 223-228 |
| 2001 |
|---|
| 37 | EE | Antonis M. Paschalis,
Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Yervant Zorian:
Deterministic software-based self-testing of embedded processor cores.
DATE 2001: 92-96 |
| 36 | EE | Nektarios Kranitis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths.
ISQED 2001: 343-349 |
| 35 | EE | Mihalis Psarakis,
Antonis M. Paschalis,
Nektarios Kranitis,
Dimitris Gizopoulos,
Yervant Zorian:
Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers.
VTS 2001: 15-21 |
| 34 | EE | Nektarios Kranitis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Mihalis Psarakis,
Yervant Zorian:
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths.
J. Electronic Testing 17(2): 97-107 (2001) |
| 2000 |
|---|
| 33 | EE | Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Antonis M. Paschalis,
Yervant Zorian:
Effective Low Power BIST for Datapaths.
DATE 2000: 757 |
| 32 | EE | Dimitris Gizopoulos,
Nektarios Kranitis,
Mihalis Psarakis,
Antonis M. Paschalis,
Yervant Zorian:
Low Power/Energy BIST Scheme for Datapaths.
VTS 2000: 23-28 |
| 31 | EE | Nektarios Kranitis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Mihalis Psarakis,
Yervant Zorian:
Power-/Energy Efficient BIST Schemes for Processor Data Paths.
IEEE Design & Test of Computers 17(4): 15-28 (2000) |
| 30 | EE | Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays.
IEEE Trans. Computers 49(10): 1083-1099 (2000) |
| 1999 |
|---|
| 29 | EE | Antonis M. Paschalis,
Nektarios Kranitis,
Mihalis Psarakis,
Dimitris Gizopoulos,
Yervant Zorian:
An Effective BIST Architecture for Fast Multiplier Cores.
DATE 1999: 117-121 |
| 28 | EE | Mihalis Psarakis,
Antonis M. Paschalis,
Dimitris Gizopoulos,
Yervant Zorian:
An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers.
VTS 1999: 252-259 |
| 27 | | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An Effective Built-In Self-Test Scheme for Parallel Multipliers.
IEEE Trans. Computers 48(9): 936-950 (1999) |
| 26 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Nikolos,
Constantin Halatsis:
An Accumulator-Based BIST Approach for Two-Pattern Testing.
J. Electronic Testing 15(3): 267-278 (1999) |
| 1998 |
|---|
| 25 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Nikolos,
Constantinos Halatsis:
R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique.
ITC 1998: 918-925 |
| 24 | EE | Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model.
VTS 1998: 152-157 |
| 23 | EE | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
Effective Built-In Self-Test for Booth Multipliers.
IEEE Design & Test of Computers 15(3): 105-111 (1998) |
| 22 | EE | Antonis M. Paschalis,
Dimitris Gizopoulos,
Nikolaos Gaitanis:
Concurrent Delay Testing in Totally Self-Checking Systems.
J. Electronic Testing 12(1-2): 55-61 (1998) |
| 21 | EE | Antonis M. Paschalis,
Nikolaos Gaitanis,
Dimitris Gizopoulos,
Panagiotis Kostarakis:
A Totally Self-Checking 1-out-of-3 Code Error Indicator.
J. Electronic Testing 13(1): 61-66 (1998) |
| 20 | EE | Mihalis Psarakis,
Dimitris Gizopoulos,
Antonis M. Paschalis:
Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools.
J. Electronic Testing 13(3): 315-319 (1998) |
| 1997 |
|---|
| 19 | EE | Antonis M. Paschalis,
Nikolaos Gaitanis,
Dimitris Gizopoulos,
Panagiotis Kostarakis:
A totally self-checking 1-out-of-3 code error indicator.
ED&TC 1997: 450-454 |
| 18 | | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian,
Mihalis Psarakis:
An Effective BIST Scheme for Arithmetic Logic Units.
ITC 1997: 868-877 |
| 17 | EE | Dimitris Gizopoulos,
Mihalis Psarakis,
Antonis M. Paschalis:
Robust Sequential Fault Testing of Iterative Logic Arrays.
VTS 1997: 238-244 |
| 1996 |
|---|
| 16 | | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An Effective BIST Scheme for Datapaths.
ITC 1996: 76-85 |
| 15 | EE | Nikolaos Gaitanis,
Dimitris Gizopoulos,
Antonis M. Paschalis,
Panagiotis Kostarakis:
An asynchronous totally self-checking two-rail code error indicator.
VTS 1996: 151-156 |
| 14 | EE | Dimitris Gizopoulos,
Dimitris Nikolos,
Antonis M. Paschalis:
Testing CMOS combinational iterative logic arrays for realistic faults.
Integration 21(3): 209-228 (1996) |
| 13 | EE | Ioannis Voyiatzis,
Antonis M. Paschalis,
Dimitris Nikolos,
Constantin Halatsis:
An efficient built-in self test method for robust path delay fault testing.
J. Electronic Testing 8(2): 219-222 (1996) |
| 12 | EE | Dimitris Gizopoulos,
Dimitris Nikolos,
Antonis M. Paschalis,
Constantin Halatsis:
C-Testable modified-Booth multipliers.
J. Electronic Testing 8(3): 241-260 (1996) |
| 1995 |
|---|
| 11 | EE | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An effective BIST scheme for carry-save and carry-propagate array multipliers.
Asian Test Symposium 1995: 298-302 |
| 10 | EE | Ioannis Voyiatzis,
Dimitris Nikolos,
Antonis M. Paschalis,
Constantinos Halatsis,
Th. Haniotakis:
An efficient comparative concurrent Built-In Self-Test technique.
Asian Test Symposium 1995: 309-315 |
| 9 | EE | Nikolaos Gaitanis,
Panagiotis Kostarakis,
Antonis M. Paschalis:
Totally Self Checking reconfigurable duplication system with separate internal fault indication.
Asian Test Symposium 1995: 316-321 |
| 8 | | Dimitris Gizopoulos,
Antonis M. Paschalis,
Yervant Zorian:
An Effective BIST Scheme for Booth Multipliers.
ITC 1995: 824-833 |
| 7 | EE | Dimitris Gizopoulos,
Dimitris Nikolos,
Antonis M. Paschalis:
Testing combinational iterative logic arrays for realistic faults.
VTS 1995: 35-41 |
| 6 | | Th. Haniotakis,
Antonis M. Paschalis,
Dimitris Nikolos:
Efficient Totally Self-Checking Checkers for a Class of Borden Codes.
IEEE Trans. Computers 44(11): 1318-1322 (1995) |
| 5 | | Vassilios V. Dimakopoulos,
G. Sourtziotis,
Antonis M. Paschalis,
Dimitris Nikolos:
On TSC Checkers for m-out-n Codes.
IEEE Trans. Computers 44(8): 1055-1059 (1995) |
| 1990 |
|---|
| 4 | | Antonis M. Paschalis,
Costas Efstathiou,
Constantine Halatsis:
An Efficient TSC 1-out-of-3 Code Checker.
IEEE Trans. Computers 39(3): 407-411 (1990) |
| 1988 |
|---|
| 3 | | Antonis M. Paschalis,
Dimitris Nikolos,
Constantine Halatsis:
Efficient Modular Design of TSC Checkers for M-out-of-2M Codes.
IEEE Trans. Computers 37(3): 301-309 (1988) |
| 2 | | Dimitris Nikolos,
Antonis M. Paschalis,
George Philokyprou:
Efficient Design of Totally Self-Checking Checkers for all Low-Cost Arithmetic Codes.
IEEE Trans. Computers 37(7): 807-814 (1988) |
| 1986 |
|---|
| 1 | | Antonis M. Paschalis,
Dimitris Nikolos,
Constantine Halatsis:
Efficient Modular Design of TSC Checkers for M-out-of-2M Codes.
Aegean Workshop on Computing 1986: 144-155 |
