| 2003 |
|---|
| 8 | EE | Monica Lobetti Bodoni,
Ben Bennetts:
Guest Editors' Introduction: Board Test.
IEEE Design & Test of Computers 20(2): 5-7 (2003) |
| 2002 |
|---|
| 7 | EE | Monica Lobetti Bodoni:
Panel: "Board Test and ITC: What Does the Future Hold?".
ITC 2002: 1239 |
| 2001 |
|---|
| 6 | EE | Alfredo Benso,
Silvia Chiusano,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
Online and Offline BIST in IP-Core Design.
IEEE Design & Test of Computers 18(5): 92-99 (2001) |
| 2000 |
|---|
| 5 | EE | Alfredo Benso,
Stefano Di Carlo,
Silvia Chiusano,
Paolo Prinetto,
Fabio Ricciato,
Monica Lobetti Bodoni,
Maurizio Spadari:
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs.
ICCD 2000: 539-540 |
| 4 | EE | Alfredo Benso,
Silvia Chiusano,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
A Family of Self-Repair SRAM Cores.
IOLTW 2000: 214-218 |
| 3 | | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs.
ITC 2000: 557-566 |
| 1999 |
|---|
| 2 | | Monica Lobetti Bodoni,
Alessio Pricco,
Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
An on-line BISTed SRAM IP core.
ITC 1999: 993-1000 |
| 1996 |
|---|
| 1 | EE | Stefano Barbagallo,
Monica Lobetti Bodoni,
Davide Medina,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Scan insertion criteria for low design impact.
VTS 1996: 26-31 |
