| |
| 1996 | ||
|---|---|---|
| 3 | EE | J. van Spaandonk, Tom A. M. Kevenaar: Iterative test-point selection for analog circuits. VTS 1996: 66-73 |
| 2 | EE | J. van Spaandonk, Tom A. M. Kevenaar: Selecting measurements to test the functional behavior of analog circuits. J. Electronic Testing 9(1-2): 9-18 (1996) |
| 1993 | ||
| 1 | Domine Leenaerts, J. van Spaandonk: DC Testing of Analog Integrated Circuits with Piecewise Linear Approximation and Interval Analysis. ISCAS 1993: 1337-1340 | |
| 1 | Tom A. M. Kevenaar | [2] [3] |
| 2 | Domine Leenaerts | [1] |