| 1998 |
|---|
| 3 | EE | Stefano Barbagallo,
Davide Medina,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Integrating Online and Offline Testing of a Switching Memory.
IEEE Design & Test of Computers 15(1): 63-70 (1998) |
| 1996 |
|---|
| 2 | EE | Stefano Barbagallo,
Monica Lobetti Bodoni,
Davide Medina,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Scan insertion criteria for low design impact.
VTS 1996: 26-31 |
| 1995 |
|---|
| 1 | EE | Paolo Camurati,
Paolo Prinetto,
Matteo Sonza Reorda,
Stefano Barbagallo,
Andrea Burri,
Davide Medina:
Industrial BIST of Embedded RAMs.
IEEE Design & Test of Computers 12(3): 86-95 (1995) |
