| 1998 |
|---|
| 18 | EE | William R. Simpson:
Enough is enough already.
ITC 1998: 1127 |
| 17 | | John W. Sheppard,
William R. Simpson:
Managing Conflict in System Diagnosis.
IEEE Computer 31(3): 69-76 (1998) |
| 1997 |
|---|
| 16 | | William R. Simpson:
Ethics, Professionalism and Accountability in Testing.
ITC 1997: 1034 |
| 1996 |
|---|
| 15 | | William R. Simpson:
The Key to Concurrent Engineering is Design Tools.
ITC 1996: 937 |
| 14 | EE | John W. Sheppard,
William R. Simpson:
Improving the accuracy of diagnostics provided by fault dictionaries.
VTS 1996: 180-185 |
| 1995 |
|---|
| 13 | | William R. Simpson:
Cutting the Cost of Test; the Value-added Way.
ITC 1995: 921 |
| 1994 |
|---|
| 12 | | William R. Simpson:
A D&T Special Report: Defining ATLAS 2000.
IEEE Design & Test of Computers 11(4): 65-69 (1994) |
| 1993 |
|---|
| 11 | | William R. Simpson,
John W. Sheppard:
The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis.
ITC 1993: 30-36 |
| 10 | EE | William R. Simpson,
John W. Sheppard:
Fault Isolation in an Integrated Diagnostic Environment.
IEEE Design & Test of Computers 10(1): 52-66 (1993) |
| 9 | EE | John W. Sheppard,
William R. Simpson:
Performing Effective Fault Isolation in Integrated Diagnostics.
IEEE Design & Test of Computers 10(2): 78-90 (1993) |
| 1992 |
|---|
| 8 | | William R. Simpson,
John W. Sheppard:
System Perspective on Diagnostic Testing.
ITC 1992: 547 |
| 7 | EE | William R. Simpson,
John W. Sheppard:
System Testability Assessment for Integrated Diagnostics.
IEEE Design & Test of Computers 9(1): 40-54 (1992) |
| 6 | EE | John W. Sheppard,
William R. Simpson:
Applying Testability Analysis for Integrated Diagnostics.
IEEE Design & Test of Computers 9(3): 65-78 (1992) |
| 1991 |
|---|
| 5 | | William R. Simpson,
John W. Sheppard:
An Intelligent Approach to Automatic Test Equipment.
ITC 1991: 419-425 |
| 4 | EE | William R. Simpson,
John W. Sheppard:
System Complexity and Integrated Diagnostics.
IEEE Design & Test of Computers 8(3): 16-30 (1991) |
| 3 | EE | John W. Sheppard,
William R. Simpson:
A Mathematical Model for Integrated Diagnostics.
IEEE Design & Test of Computers 8(4): 25-38 (1991) |
| 1990 |
|---|
| 2 | EE | John W. Sheppard,
William R. Simpson:
Using a Competitive Learning Neural Network to Evaluate Software Complexity.
SIGSMALL/PC Symposium 1990: 262-267 |
| 1988 |
|---|
| 1 | EE | John W. Sheppard,
William R. Simpson:
Functional path analysis: an approach to software verification.
ACM Conference on Computer Science 1988: 266-272 |
