| 2007 |
|---|
| 22 | EE | John W. Sheppard,
S. G. W. Butcher:
A Formal Analysis of Fault Diagnosis with D-matrices.
J. Electronic Testing 23(4): 309-322 (2007) |
| 1998 |
|---|
| 21 | | John W. Sheppard,
William R. Simpson:
Managing Conflict in System Diagnosis.
IEEE Computer 31(3): 69-76 (1998) |
| 20 | EE | Lee A. Shombert,
John W. Sheppard:
A Behavior Model for Next Generation Test Systems.
J. Electronic Testing 13(3): 299-314 (1998) |
| 19 | | John W. Sheppard:
Colearning in Differential Games.
Machine Learning 33(2-3): 201-233 (1998) |
| 1997 |
|---|
| 18 | | John W. Sheppard,
Leslie A. Orlidge:
Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)-A New Standard for System Diagnostics.
ITC 1997: 1020-1029 |
| 17 | | John W. Sheppard,
Steven Salzberg:
A Teaching Strategy for Memory-Based Control.
Artif. Intell. Rev. 11(1-5): 343-370 (1997) |
| 1996 |
|---|
| 16 | EE | John W. Sheppard,
William R. Simpson:
Improving the accuracy of diagnostics provided by fault dictionaries.
VTS 1996: 180-185 |
| 15 | EE | J. El-Ziq,
Najmi T. Jarwala,
Niraj K. Jha,
Peter Marwedel,
Christos A. Papachristou,
Janusz Rajski,
John W. Sheppard:
Hardware-Software Co-Design for Test: It's the Last Straw!
VTS 1996: 506-507 |
| 14 | | John W. Sheppard:
SCC20 attracts IEC participation.
IEEE Design & Test of Computers 13(1): 2- (1996) |
| 1995 |
|---|
| 13 | | John W. Sheppard,
Steven Salzberg:
Combining Genetic Algorithms with Memory Based Reasoning.
ICGA 1995: 452-459 |
| 1993 |
|---|
| 12 | | John W. Sheppard:
Testing Fully Testable Systems: A Case Study.
ITC 1993: 268 |
| 11 | | William R. Simpson,
John W. Sheppard:
The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis.
ITC 1993: 30-36 |
| 10 | EE | William R. Simpson,
John W. Sheppard:
Fault Isolation in an Integrated Diagnostic Environment.
IEEE Design & Test of Computers 10(1): 52-66 (1993) |
| 9 | EE | John W. Sheppard,
William R. Simpson:
Performing Effective Fault Isolation in Integrated Diagnostics.
IEEE Design & Test of Computers 10(2): 78-90 (1993) |
| 1992 |
|---|
| 8 | | William R. Simpson,
John W. Sheppard:
System Perspective on Diagnostic Testing.
ITC 1992: 547 |
| 7 | EE | William R. Simpson,
John W. Sheppard:
System Testability Assessment for Integrated Diagnostics.
IEEE Design & Test of Computers 9(1): 40-54 (1992) |
| 6 | EE | John W. Sheppard,
William R. Simpson:
Applying Testability Analysis for Integrated Diagnostics.
IEEE Design & Test of Computers 9(3): 65-78 (1992) |
| 1991 |
|---|
| 5 | | William R. Simpson,
John W. Sheppard:
An Intelligent Approach to Automatic Test Equipment.
ITC 1991: 419-425 |
| 4 | EE | William R. Simpson,
John W. Sheppard:
System Complexity and Integrated Diagnostics.
IEEE Design & Test of Computers 8(3): 16-30 (1991) |
| 3 | EE | John W. Sheppard,
William R. Simpson:
A Mathematical Model for Integrated Diagnostics.
IEEE Design & Test of Computers 8(4): 25-38 (1991) |
| 1990 |
|---|
| 2 | EE | John W. Sheppard,
William R. Simpson:
Using a Competitive Learning Neural Network to Evaluate Software Complexity.
SIGSMALL/PC Symposium 1990: 262-267 |
| 1988 |
|---|
| 1 | EE | John W. Sheppard,
William R. Simpson:
Functional path analysis: an approach to software verification.
ACM Conference on Computer Science 1988: 266-272 |
