2008 |
30 | EE | Michael Gössel,
Egor S. Sogomonyan:
A Non-linear Split Error Detection Code.
Fundam. Inform. 83(1-2): 109-115 (2008) |
2006 |
29 | EE | Cristian Grecu,
André Ivanov,
Res Saleh,
Egor S. Sogomonyan,
Partha Pratim Pande:
On-line Fault Detection and Location for NoC Interconnects.
IOLTS 2006: 145-150 |
28 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider.
IOLTS 2006: 23-30 |
27 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan,
Daniel Marienfeld:
Modulo p=3 Checking for a Carry Select Adder.
J. Electronic Testing 22(1): 101-107 (2006) |
2005 |
26 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors.
Asian Test Symposium 2005: 76-81 |
2004 |
25 | | Egor S. Sogomonyan,
Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel:
Self-checking Carry-selectAdder with Sum-bit Duplication.
ARCS Workshops 2004: 84-91 |
24 | EE | Egor S. Sogomonyan,
Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder.
DATE 2004: 1360-1361 |
23 | EE | Vitalij Ocheretnij,
Daniel Marienfeld,
Egor S. Sogomonyan,
Michael Gössel:
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits.
IOLTS 2004: 31-36 |
2003 |
22 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan,
Daniel Marienfeld:
A Modulo p Checked Self-Checking Carry Select Adder.
IOLTS 2003: 25-29 |
21 | EE | Kartik Mohanram,
Egor S. Sogomonyan,
Michael Gössel,
Nur A. Touba:
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits.
IOLTS 2003: 35- |
20 | EE | Adit D. Singh,
Markus Seuring,
Michael Gössel,
Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores.
ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) |
2002 |
19 | EE | Daniel Marienfeld,
Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan:
Partially Duplicated Code-Disjoint Carry-Skip Adder.
DFT 2002: 78-86 |
18 | EE | Daniel Marienfeld,
Egor S. Sogomonyan,
Vitalij Ocheretnij,
Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder.
IOLTW 2002: 39-43 |
17 | EE | Michael Gössel,
Egor S. Sogomonyan,
Adit D. Singh:
Scan-Path with Directly Duplicated and Inverted Duplicated Registers.
VTS 2002: 47-52 |
2001 |
16 | EE | Vitalij Ocheretnij,
Egor S. Sogomonyan,
Michael Gössel:
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes.
Asian Test Symposium 2001: 365- |
15 | EE | Vitalij Ocheretnij,
Michael Gössel,
Egor S. Sogomonyan:
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead.
IOLTW 2001: 147-152 |
14 | EE | Egor S. Sogomonyan,
A. A. Morosov,
Jan Rzeha,
Michael Gössel,
Adit D. Singh:
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging.
VTS 2001: 184-189 |
1999 |
13 | | Adit D. Singh,
Egor S. Sogomonyan,
Michael Gössel,
Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element.
ITC 1999: 286-293 |
12 | EE | Michael Gössel,
A. A. Morosov,
Egor S. Sogomonyan:
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces.
VTS 1999: 49-57 |
11 | EE | Egor S. Sogomonyan,
Adit D. Singh,
Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.
J. Electronic Testing 15(1-2): 87-96 (1999) |
1998 |
10 | EE | Egor S. Sogomonyan,
Adit D. Singh,
Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.
VTS 1998: 324-331 |
9 | EE | Markus Seuring,
Michael Gössel,
Egor S. Sogomonyan:
A Structural Approach for Space Compaction for Concurrent Checking and BIST.
VTS 1998: 354-361 |
1997 |
8 | EE | Hendrik Hartje,
Michael Gössel,
Egor S. Sogomonyan:
Code-Disjoint Circuits for Parity Circuits.
Asian Test Symposium 1997: 100- |
7 | EE | Andrzej Hlawiczka,
Michael Gössel,
Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR.
VTS 1997: 350-355 |
1996 |
6 | EE | Egor S. Sogomonyan,
Michael Gössel:
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems.
VTS 1996: 138-144 |
5 | | S. Kundu,
Egor S. Sogomonyan,
Michael Gössel,
Steffen Tarnick:
Self-Checking Comparator with One Periodic Output.
IEEE Trans. Computers 45(3): 379-380 (1996) |
4 | EE | Michael Gössel,
Egor S. Sogomonyan:
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST.
J. Electronic Testing 8(2): 165-177 (1996) |
1993 |
3 | | Egor S. Sogomonyan,
Michael Gössel:
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection.
DFT 1993: 239-246 |
2 | | Michael Gössel,
Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design.
VLSI 1993: 103-111 |
1 | EE | Egor S. Sogomonyan,
Michael Gössel:
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs.
J. Electronic Testing 4(3): 267-281 (1993) |