2008 | ||
---|---|---|
26 | EE | Phil Nigh: The Evolving Role of Test ... it is now a "Value Add" Operation. DFT 2008: 3-3 |
25 | EE | François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh: How Many Test Patterns are Useless? VTS 2008: 23-28 |
2006 | ||
24 | EE | Phil Nigh: Session Abstract. VTS 2006: 44 |
23 | EE | Phil Nigh: Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Design & Test of Computers 23(2): 86-87 (2006) |
2005 | ||
22 | EE | Vikram Iyengar, Phil Nigh: Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium 2005: 455 |
2004 | ||
21 | EE | Phil Nigh: Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC 2004: 1420 |
20 | EE | Phil Nigh: Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC 2004: 1429 |
19 | EE | Phil Nigh, Anne E. Gattiker: Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318 |
2003 | ||
18 | EE | Phil Nigh: The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC 2003: 1281 |
2002 | ||
17 | EE | Phil Nigh: Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC 2002: 1198 |
16 | EE | Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314 |
2001 | ||
15 | EE | Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345 |
2000 | ||
14 | Phil Nigh, Anne E. Gattiker: Test method evaluation experiments and data. ITC 2000: 454-463 | |
1999 | ||
13 | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161 | |
1998 | ||
12 | EE | Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10 |
11 | EE | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1998: 43- |
10 | EE | Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika: Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739 |
9 | EE | Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461 |
1997 | ||
8 | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038 | |
7 | EE | Phil Nigh: SIA Roadmap: test must not limit future technologies. ITC 1997: 1152 |
6 | Phil Nigh, Donato Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327 | |
5 | Adit D. Singh, Phil Nigh, C. Mani Krishna: Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC 1997: 362-369 | |
4 | EE | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459 |
1996 | ||
3 | EE | Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck: Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS 1996: 212-213 |
1994 | ||
2 | Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix: ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102 | |
1990 | ||
1 | EE | Phil Nigh, Wojciech Maly: Test Generation for Current Testing (CMOS ICs). IEEE Design & Test of Computers 7(1): 26-38 (1990) |