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Phil Nigh

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2008
26EEPhil Nigh: The Evolving Role of Test ... it is now a "Value Add" Operation. DFT 2008: 3-3
25EEFrançois-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh: How Many Test Patterns are Useless? VTS 2008: 23-28
2006
24EEPhil Nigh: Session Abstract. VTS 2006: 44
23EEPhil Nigh: Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Design & Test of Computers 23(2): 86-87 (2006)
2005
22EEVikram Iyengar, Phil Nigh: Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium 2005: 455
2004
21EEPhil Nigh: Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC 2004: 1420
20EEPhil Nigh: Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC 2004: 1429
19EEPhil Nigh, Anne E. Gattiker: Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318
2003
18EEPhil Nigh: The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC 2003: 1281
2002
17EEPhil Nigh: Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC 2002: 1198
16EEEdward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314
2001
15EEChao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345
2000
14 Phil Nigh, Anne E. Gattiker: Test method evaluation experiments and data. ITC 2000: 454-463
1999
13 Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161
1998
12EEAdit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10
11EEPhil Nigh, David P. Vallett, Atul Patel, Jason Wright: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1998: 43-
10EEDaniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika: Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739
9EEPeter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461
1997
8 Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
7EEPhil Nigh: SIA Roadmap: test must not limit future technologies. ITC 1997: 1152
6 Phil Nigh, Donato Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327
5 Adit D. Singh, Phil Nigh, C. Mani Krishna: Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC 1997: 362-369
4EEPhil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
1996
3EERobert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck: Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS 1996: 212-213
1994
2 Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix: ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102
1990
1EEPhil Nigh, Wojciech Maly: Test Generation for Current Testing (CMOS ICs). IEEE Design & Test of Computers 7(1): 26-38 (1990)

Coauthor Index

1Robert C. Aitken [3] [4] [8]
2Steve Baird [9]
3Kenneth M. Butler [4] [8]
4Ray Chen [15]
5Wendy Chong [13]
6Al Crouch [9]
7François-Fabien Ferhani [25]
8Donato Forlenza [6] [13]
9Anne E. Gattiker [14] [19]
10Leendert M. Huisman [10]
11J. Hutcheson [3]
12Vikram Iyengar [22]
13Jeffrey A. Kash [10]
14Daniel R. Knebel [10]
15C. Mani Krishna (C. M. Krishna) [5]
16Ray Kurtulik [13]
17Luke Lacroix [2]
18David R. Lakin II [12]
19Bob Madge [16]
20Wojciech Maly [1] [8]
21Peter C. Maxwell [4] [8] [9] [16]
22Edward J. McCluskey [15] [16] [25]
23Moyra K. McManus [10]
24Jeanne Trinko Mechler [2]
25Subhasish Mitra [16]
26Franco Motika [6] [10] [13]
27N. Murthy [3]
28Wayne M. Needham [4] [8] [9]
29Atul Patel [11] [13]
30Rick Rizzolo [10]
31Mike Rodgers [16]
32Pia Sanda [10]
33Nirmal R. Saxena [25]
34Adit D. Singh [5] [12]
35Gaurav Sinha [12]
36Peilin Song [10]
37Nicholas Sporck [3]
38James C. Tsang [10]
39Chao-Wen Tseng [15]
40David P. Vallett [10] [11] [13]
41Donald L. Wheater [2]
42Jason Wright [11] [13]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)