Phil Nigh

2008
26	EE	Phil Nigh: The Evolving Role of Test ... it is now a "Value Add" Operation. DFT 2008: 3-3
25	EE	François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh: How Many Test Patterns are Useless? VTS 2008: 23-28
2006
24	EE	Phil Nigh: Session Abstract. VTS 2006: 44
23	EE	Phil Nigh: Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Design & Test of Computers 23(2): 86-87 (2006)
2005
22	EE	Vikram Iyengar, Phil Nigh: Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium 2005: 455
2004
21	EE	Phil Nigh: Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC 2004: 1420
20	EE	Phil Nigh: Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC 2004: 1429
19	EE	Phil Nigh, Anne E. Gattiker: Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318
2003
18	EE	Phil Nigh: The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC 2003: 1281
2002
17	EE	Phil Nigh: Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC 2002: 1198
16	EE	Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314
2001
15	EE	Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345
2000
14		Phil Nigh, Anne E. Gattiker: Test method evaluation experiments and data. ITC 2000: 454-463
1999
13		Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161
1998
12	EE	Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10
11	EE	Phil Nigh, David P. Vallett, Atul Patel, Jason Wright: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1998: 43-
10	EE	Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika: Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739
9	EE	Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461
1997
8		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
7	EE	Phil Nigh: SIA Roadmap: test must not limit future technologies. ITC 1997: 1152
6		Phil Nigh, Donato Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327
5		Adit D. Singh, Phil Nigh, C. Mani Krishna: Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC 1997: 362-369
4	EE	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
1996
3	EE	Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck: Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS 1996: 212-213
1994
2		Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix: ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102
1990
1	EE	Phil Nigh, Wojciech Maly: Test Generation for Current Testing (CMOS ICs). IEEE Design & Test of Computers 7(1): 26-38 (1990)

Coauthor Index

1	Robert C. Aitken	[3] [4] [8]
2	Steve Baird	[9]
3	Kenneth M. Butler	[4] [8]
4	Ray Chen	[15]
5	Wendy Chong	[13]
6	Al Crouch	[9]
7	François-Fabien Ferhani	[25]
8	Donato Forlenza	[6] [13]
9	Anne E. Gattiker	[14] [19]
10	Leendert M. Huisman	[10]
11	J. Hutcheson	[3]
12	Vikram Iyengar	[22]
13	Jeffrey A. Kash	[10]
14	Daniel R. Knebel	[10]
15	C. Mani Krishna (C. M. Krishna)	[5]
16	Ray Kurtulik	[13]
17	Luke Lacroix	[2]
18	David R. Lakin II	[12]
19	Bob Madge	[16]
20	Wojciech Maly	[1] [8]
21	Peter C. Maxwell	[4] [8] [9] [16]
22	Edward J. McCluskey	[15] [16] [25]
23	Moyra K. McManus	[10]
24	Jeanne Trinko Mechler	[2]
25	Subhasish Mitra	[16]
26	Franco Motika	[6] [10] [13]
27	N. Murthy	[3]
28	Wayne M. Needham	[4] [8] [9]
29	Atul Patel	[11] [13]
30	Rick Rizzolo	[10]
31	Mike Rodgers	[16]
32	Pia Sanda	[10]
33	Nirmal R. Saxena	[25]
34	Adit D. Singh	[5] [12]
35	Gaurav Sinha	[12]
36	Peilin Song	[10]
37	Nicholas Sporck	[3]
38	James C. Tsang	[10]
39	Chao-Wen Tseng	[15]
40	David P. Vallett	[10] [11] [13]
41	Donald L. Wheater	[2]
42	Jason Wright	[11] [13]

Colors in the list of coauthors