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| 2001 | ||
|---|---|---|
| 2 | EE | Masaru Sanada: Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ. J. Electronic Testing 17(3-4): 275-281 (2001) |
| 1996 | ||
| 1 | EE | Masaru Sanada: A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq. VTS 1996: 186-191 |