2008 |
115 | EE | Dario Bonino,
Fulvio Corno:
Self-Similarity Metric for Index Pruning in Conceptual Vector Space Models.
DEXA Workshops 2008: 225-229 |
114 | EE | Emiliano Castellina,
Fulvio Corno,
Paolo Pellegrino:
Integrated speech and gaze control for realistic desktop environments.
ETRA 2008: 79-82 |
113 | EE | Andrea Calvo,
Adriano Chiò,
Emiliano Castellina,
Fulvio Corno,
Laura Farinetti,
Paolo Ghiglione,
Valentina Pasian,
Alessandro Vignola:
Eye Tracking Impact on Quality-of-Life of ALS Patients.
ICCHP 2008: 70-77 |
112 | EE | Dario Bonino,
Emiliano Castellina,
Fulvio Corno:
DOG: An Ontology-Powered OSGi Domotic Gateway.
ICTAI (1) 2008: 157-160 |
111 | EE | Dario Bonino,
Fulvio Corno:
DogOnt - Ontology Modeling for Intelligent Domotic Environments.
International Semantic Web Conference 2008: 790-803 |
110 | EE | Dario Bonino,
Emiliano Castellina,
Fulvio Corno:
Uniform Access to Domotic Environments through Semantics.
SWAP 2008 |
2007 |
109 | EE | Dario Bonino,
Fulvio Corno,
Paolo Pellegrino:
Versatile RDF Representation for Multimedia Semantic Search.
ICTAI (2) 2007: 32-38 |
108 | EE | Alessio Bosca,
Dario Bonino,
Marco Comerio,
Simone Grega,
Fulvio Corno:
A reusable 3D visualization component for the semantic web.
Web3D 2007: 89-96 |
2006 |
107 | EE | Paolo Pellegrino,
Dario Bonino,
Fulvio Corno:
Domotic house gateway.
SAC 2006: 1915-1920 |
106 | EE | Paolo Pellegrino,
Fulvio Corno:
An Extensible Platform for Semantic Classification And Retrieval of Multimedia Resources.
SWAP 2006 |
105 | EE | Alessio Bosca,
Fulvio Corno,
Giuseppe Valetto,
Roberta Maglione:
On-the-fly Construction of Web Services Compositions from Natural Language Requests.
JSW 1(1): 40-50 (2006) |
2005 |
104 | EE | Alessio Bosca,
Giuseppe Valetto,
Roberta Maglione,
Fulvio Corno:
Specifying Web Service Compositions on the Basis of Natural Language Requests.
ICSOC 2005: 588-593 |
103 | EE | Alessio Bosca,
Andrea Ferrato,
Fulvio Corno,
Ilenia Congiu,
Giuseppe Valetto:
Composing Web Services on the Basis of Natural Language Requests.
ICWS 2005: 817-818 |
102 | EE | Dario Bonino,
Fulvio Corno,
Federico Pescarmona:
Automatic learning of text-to-concept mappings exploiting WordNet-like lexical networks.
SAC 2005: 1639-1644 |
101 | EE | Fulvio Corno,
Ernesto Sánchez,
Giovanni Squillero:
Evolving assembly programs: how games help microprocessor validation.
IEEE Trans. Evolutionary Computation 9(6): 695-706 (2005) |
2004 |
100 | | Fulvio Corno,
Tina Ebey,
Anna Grabowska,
Iliana Nikolova,
Evgenia Sendova:
Impact of Technology on Learning Paradigms and Teaching Practices.
EDUTECH 2004: 199-200 |
99 | | Fulvio Corno:
E-learning Issues for Advanced Technical Topics.
EDUTECH 2004: 201-206 |
98 | EE | Dario Bonino,
Alessio Bosca,
Fulvio Corno:
An Agent Based Autonomic Semantic Platform.
ICAC 2004: 189-196 |
97 | EE | Dario Bonino,
Fulvio Corno,
Laura Farinetti:
Domain Specific Searches Using Conceptual Spectra.
ICTAI 2004: 680-687 |
96 | EE | Fulvio Corno,
Matteo Sonza Reorda,
S. Tosato,
F. Esposito:
Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems.
ITC 2004: 1332-1339 |
95 | EE | Dario Bonino,
Fulvio Corno,
Laura Farinetti,
Andrea Ferrato:
Multilingual semantic elaboration in the DOSE platform.
SAC 2004: 1642-1646 |
94 | EE | Fulvio Corno,
Julio Pérez Acle,
Matteo Sonza Reorda,
Massimo Violante:
A multi-level approach to the dependability analysis of networked systems based on the CAN protocol.
SBCCI 2004: 71-75 |
93 | EE | Fulvio Corno,
Ernesto Sánchez,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Test Program Generation: A Case Study.
IEEE Design & Test of Computers 21(2): 102-109 (2004) |
92 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolutionary Simulation-Based Validation.
International Journal on Artificial Intelligence Tools 13(4): 897-916 (2004) |
91 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Paolo Bernardi,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
J. Electronic Testing 20(1): 79-87 (2004) |
90 | EE | Fulvio Corno,
Ernesto Sánchez,
Matteo Sonza Reorda,
Giovanni Squillero:
Code Generation for Functional Validation of Pipelined Microprocessors.
J. Electronic Testing 20(3): 269-278 (2004) |
2003 |
89 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Fully Automatic Test Program Generation for Microprocessor Cores.
DATE 2003: 11006-11011 |
88 | EE | Fulvio Corno,
S. Tosato,
P. Gabrielli:
System-Level Analysis of Fault Effects in an Automotive Environment.
DFT 2003: 529-536 |
87 | EE | Fulvio Corno,
Giovanni Squillero:
An Enhanced Framework for Microprocessor Test-Program Generation.
EuroGP 2003: 307-316 |
86 | EE | Fulvio Corno,
F. Cumani,
Giovanni Squillero:
Exploiting Auto-adaptive 7GP for Highly Effective Test Programs Generation.
ICES 2003: 262-273 |
85 | EE | Dario Bonino,
Fulvio Corno,
Laura Farinetti:
DOSE: A Distributed Open Semantic Elaboration Platform.
ICTAI 2003: 580-588 |
84 | | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Test Program Generation for Pipeline Processors.
SAC 2003: 736-740 |
83 | EE | Dario Bonino,
Fulvio Corno,
Giovanni Squillero:
An Evolutionary Approach to Web Request Prediction.
WWW (Posters) 2003 |
82 | EE | Dario Bonino,
Fulvio Corno,
Giovanni Squillero:
A Real-Time Evolutionary Algorithm for Web Prediction.
Web Intelligence 2003: 139-145 |
2002 |
81 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolutionary Test Program Induction for Microprocessor Design Verification.
Asian Test Symposium 2002: 368-373 |
80 | EE | Luis Berrojo,
Isabel González,
Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero,
Luis Entrena,
Celia López:
New Techniques for Speeding-Up Fault-Injection Campaigns.
DATE 2002: 847-853 |
79 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolutionary Techniques for Minimizing Test Signals Application Time.
EvoWorkshops 2002: 183-189 |
78 | | Florin Bota,
Fulvio Corno,
Laura Farinetti:
Hypervideo: A Parameterized Hotspot Approach.
ICWI 2002: 620-623 |
77 | EE | Luis Berrojo,
Isabel González,
Luis Entrena,
Celia López,
Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Analysis of the Equivalences and Dominances of Transient Faults at the RT Level.
IOLTW 2002: 193 |
76 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
IOLTW 2002: 206-210 |
75 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Test Program Generation from RT-Level Microprocessor Descriptions.
ISQED 2002: 120- |
74 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
MTDT 2002: 12-16 |
73 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
An evolutionary algorithm for reducing integrated-circuit test application time.
SAC 2002: 608-612 |
72 | EE | Luis Berrojo,
Isabel González,
Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero,
Luis Entrena,
Celia López:
An Industrial Environment for High-Level Fault-Tolerant Structures Insertion and Validation.
VTS 2002: 229-236 |
71 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Giovanni Squillero:
Initializability analysis of synchronous sequential circuits.
ACM Trans. Design Autom. Electr. Syst. 7(2): 249-264 (2002) |
2001 |
70 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Effective Techniques for High-Level ATPG.
Asian Test Symposium 2001: 225- |
69 | EE | Davide Appello,
Fulvio Corno,
M. Giovinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis.
Asian Test Symposium 2001: 97-102 |
68 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero,
Massimo Violante:
On the test of microprocessor IP cores.
DATE 2001: 209-213 |
67 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
ARPIA: A High-Level Evolutionary Test Signal Generator.
EvoWorkshops 2001: 298-306 |
66 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolving effective CA/CSTP: BIST architectures for sequential circuits.
SAC 2001: 345-350 |
65 | | Florin Bota,
Laura Farinetti,
Fulvio Corno:
Interactive Visit of a Website.
WebNet 2001: 93-97 |
2000 |
64 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero,
Alberto Manzone,
Alessandro Pincetti:
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience.
DATE 2000: 385-389 |
63 | | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Validation of Protocol Interfaces Described in VHDL.
EvoWorkshops 2000: 205-213 |
62 | | Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Massimo Violante:
Prediction of Power Requirements for High-Speed Circuits.
EvoWorkshops 2000: 247-254 |
61 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolving Cellular Automata for Self-Testing Hardware.
ICES 2000: 31-40 |
60 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero,
Massimo Violante:
A genetic algorithm-based system for generating test programs for microprocessor IP cores.
ICTAI 2000: 195-198 |
59 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Exploiting the Selfish Gene Algorithm for Evolving Cellular Automata.
IJCNN (6) 2000: 577-584 |
58 | EE | Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Giovanni Squillero,
Massimo Violante:
Low Power BIST via Non-Linear Hybrid Cellular Automata.
VTS 2000: 29-34 |
57 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
High-Level Observability for Effective High-Level ATPG.
VTS 2000: 411-416 |
56 | | Florin Bota,
Fulvio Corno,
Laura Farinetti:
Enhancing Interactivity for Self-Evaluation in XML-based Courseware.
WebNet 2000: 50-55 |
55 | | Fulvio Corno,
Laura Farinetti,
Giovanni Squillero:
An Intelligent User Interface oriented to non-expert users.
WebNet 2000: 675-676 |
54 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
RT-Level ITC'99 Benchmarks and First ATPG Results.
IEEE Design & Test of Computers 17(3): 44-53 (2000) |
1999 |
53 | EE | Enrique San Millán,
Luis Entrena,
José Alberto Espejo,
Silvia Chiusano,
Fulvio Corno:
Integrating Symbolic Techniques in ATPG-Based Sequential Logic Optimization.
DATE 1999: 516-520 |
52 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Approximate Equivalence Verification of Sequential Circuits via Genetic Algorithms.
DATE 1999: 754-755 |
51 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Maurizio Rebaudengo,
Massimo Violante:
Optimal Vector Selection for Low Power BIST.
DFT 1999: 219-226 |
50 | | Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Massimo Violante:
Test Pattern Generation Under Low Power Constraints.
EvoWorkshops 1999: 162-170 |
49 | | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
Approximate Equivalence Verification for Protocol Interface Implementation via Genetic Algorithms.
EvoWorkshops 1999: 182-192 |
48 | EE | Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Massimo Violante:
ALPS: A Peak Power Estimation Tool for Sequential Circuits.
Great Lakes Symposium on VLSI 1999: 350-353 |
47 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto:
RT-level TPG Exploiting High-Level Synthesis Information.
VTS 1999: 341-353 |
46 | EE | Fulvio Corno,
Uwe Gläser,
Paolo Prinetto,
Matteo Sonza Reorda,
Heinrich Theodor Vierhaus,
Massimo Violante:
SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 191-202 (1999) |
45 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto:
Exploiting Behavioral Information in Gate-Level ATPG.
J. Electronic Testing 14(1-2): 141-148 (1999) |
1998 |
44 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto:
A Test Pattern Generation Algorithm Exploiting Behavioral Information.
Asian Test Symposium 1998: 480-485 |
43 | EE | Elizabeth M. Rudnick,
Roberto Vietti,
Akilah Ellis,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques.
DATE 1998: 570-576 |
42 | EE | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda,
Massimo Violante:
Exploiting Symbolic Techniques for Partial Scan Flip Flop Selection.
DATE 1998: 670- |
41 | EE | Silvia Chiusano,
Fulvio Corno,
Matteo Sonza Reorda,
Roberto Vietti:
A System for Evaluating On-Line Testability at the RT-level.
DFT 1998: 284-291 |
40 | EE | Fulvio Corno,
Matteo Sonza Reorda,
Giovanni Squillero:
The selfish gene algorithm: a new evolutionary optimization strategy.
SAC 1998: 349-355 |
39 | EE | Fulvio Corno,
Nicola Gaudenzi,
Paolo Prinetto,
Matteo Sonza Reorda:
On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits.
VTS 1998: 424-429 |
38 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A Test Pattern Generation Methodology for Low-Power Consumption.
VTS 1998: 453-459 |
37 | | Gianpiero Cabodi,
Paolo Camurati,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
The General Product Machine: a New Model for Symbolic FSM Traversal.
Formal Methods in System Design 12(3): 267-289 (1998) |
36 | EE | Stefano Barbagallo,
Davide Medina,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Integrating Online and Offline Testing of a Switching Memory.
IEEE Design & Test of Computers 15(1): 63-70 (1998) |
1997 |
35 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Guaranteeing Testability in Re-encoding for Low Power.
Asian Test Symposium 1997: 30-35 |
34 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Giovanni Squillero:
A Genetic Algorithm for the Computation of Initialization Sequences for Synchronous Sequential Circuits.
Asian Test Symposium 1997: 56-61 |
33 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Massimo Violante:
Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG.
Asian Test Symposium 1997: 68-73 |
32 | | Mario Baldi,
Fulvio Corno,
Maurizio Rebaudengo,
Paolo Prinetto,
Matteo Sonza Reorda,
Giovanni Squillero:
Simulation-based verification of network protocols performance.
CHARME 1997: 236-251 |
31 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
New static compaction techniques of test sequences for sequential circuits.
ED&TC 1997: 37-43 |
30 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Hybrid symbolic-explicit techniques for the graph coloring problem.
ED&TC 1997: 422-426 |
29 | | F. Bianchi,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Roberto Ansaloni:
Boolean Function Manipulation on a Parallel System Using BDDs.
HPCN Europe 1997: 916-928 |
28 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Giovanni Squillero:
A new Approach for Initialization Sequences Computation for Synchronous Sequential Circuits.
ICCD 1997: 381-386 |
27 | EE | Mario Baldi,
Fulvio Corno,
Maurizio Rebaudengo,
Giovanni Squillero:
GA-Based Performance Analysis of Network Protocols.
ICTAI 1997: 118-124 |
26 | EE | S. Chuisano,
Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Exploiting Symbolic Techniques within Genetic Algorithms for Power Optimization.
ICTAI 1997: 133- |
25 | | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Testability Analysis and ATPG on Behavioral RT-Level VHDL.
ITC 1997: 753-759 |
24 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits.
SAC 1997: 228-232 |
23 | EE | Silvia Chiusano,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Cellular automata for deterministic sequential test pattern generation.
VTS 1997: 60-67 |
1996 |
22 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Maurizio Damiani,
Leonardo Impagliazzo,
G. Sartore:
On-line Testing of an Off-the-shelf Microprocessor Board for Safety-critical Applications.
EDCC 1996: 190-202 |
21 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits.
HPCN Europe 1996: 454-459 |
20 | | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
A Genetic Algorithm for Automatic Generation of Test Logic for Digital Circuits.
ICTAI 1996: 10-16 |
19 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Comparing Topological, Symbolic and GA-based ATPGs: An Experimental Approach.
ITC 1996: 39-47 |
18 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Partial Scan Flip Flop Selection for Simulation-Based Sequential ATPGs.
ITC 1996: 558-564 |
17 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Exploiting Competing Subpopulations for Automatic Generation of Test Sequences for Digital Cicuits.
PPSN 1996: 792-800 |
16 | EE | Stefano Barbagallo,
Monica Lobetti Bodoni,
Davide Medina,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Scan insertion criteria for low design impact.
VTS 1996: 26-31 |
15 | EE | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Circular Self-Test Path for FSMs.
IEEE Design & Test of Computers 13(4): 50-60 (1996) |
14 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 991-1000 (1996) |
1995 |
13 | | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Enzo Veiluva:
A PVM tool for automatic test generation on parallel and distributed systems.
HPCN Europe 1995: 39-44 |
12 | | Stefano Barbagallo,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Testing a Switching Memory in a Telcommunication System.
ITC 1995: 947-956 |
11 | EE | Fulvio Corno,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Enzo Veiluva:
A portable ATPG tool for parallel and distributed systems.
VTS 1995: 29-34 |
10 | EE | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda,
Uwe Gläser,
Heinrich Theodor Vierhaus:
Improving topological ATPG with symbolic techniques.
VTS 1995: 338-343 |
1994 |
9 | | Paolo Camurati,
Fulvio Corno,
Paolo Prinetto,
Catherine Bayol,
Bernard Soulas:
System-Level Modeling and Verification: a Comprehensive Design Methodology.
EDAC-ETC-EUROASIC 1994: 636-640 |
8 | EE | Paolo Prinetto,
Fulvio Corno,
Matteo Sonza Reorda:
An experimental analysis of the effectiveness of the circular self-test path technique.
EURO-DAC 1994: 246-251 |
7 | EE | Catherine Bayol,
Bernard Soulas,
Dominique Borrione,
Fulvio Corno,
Paolo Prinetto:
A process algebra interpretation of a verification oriented overlanguage of VHDL.
EURO-DAC 1994: 506-511 |
6 | | Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Making the Circular Self-Test Path Technique Effective for Real Circuits.
ITC 1994: 949-957 |
1993 |
5 | | Paolo Camurati,
Fulvio Corno,
Paolo Prinetto:
A Methodology for System-Level Design for Verifiability.
CHARME 1993: 80-91 |
4 | | Paolo Camurati,
Fulvio Corno,
Paolo Prinetto:
Exploiting Symbolic Traversal Techniques for Efficient Process Algebra Manipulation.
CHDL 1993: 31-44 |
3 | EE | Gianpiero Cabodi,
Paolo Camurati,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
An approach to sequential circuit diagnosis based on formal verification techniques.
J. Electronic Testing 4(1): 11-17 (1993) |
1992 |
2 | EE | Gianpiero Cabodi,
Paolo Camurati,
Fulvio Corno,
Silvano Gai,
Paolo Prinetto,
Matteo Sonza Reorda:
A New Model for Improving symbolic Product Machine Traversal.
DAC 1992: 614-619 |
1 | | Gianpiero Cabodi,
Paolo Camurati,
Fulvio Corno,
Paolo Prinetto,
Matteo Sonza Reorda:
Sequential Circuit Diagnosis Based on Formal Verification Techniques.
ITC 1992: 187-196 |